Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

2005 ◽  
Vol 87 (8) ◽  
pp. 083104 ◽  
Author(s):  
M. Heyde ◽  
M. Sterrer ◽  
H.-P. Rust ◽  
H.-J. Freund
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperature ◽  
Tuning Fork ◽  
Ultrahigh Vacuum ◽  
Quartz Tuning Fork ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

2021 ◽  
Vol 71 (5) ◽  
pp. 439-445
Author(s):  
Hyoju CHOE ◽  
Dongwon KIM ◽  
Manhee LEE* ◽  
Myungchul CHOI
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

Eigenvalue Veering in Quartz Tuning Fork Sensors and its Effect on Dynamic Atomic Force Microscopy

2014 ◽  
Author(s):  
John Melcher
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Systematic Error ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Attractive Alternative ◽  
Small Shift ◽  
Force Microscopy ◽  
Sensing Applications ◽  
Atomic Force

Quartz tuning fork (QTF) sensors offer an attractive alternative to traditional silicon microcantilevers for sensing applications in dynamic atomic force microscopy (DAFM). The QTF sensor consists of two identical, weakly-coupled tines with a sharp tip affixed to the distal end of one tine. The fundamental anti-phase mode of the QTF achieves a stable resonant frequency with a high Quality factor making it ideal for DAFM applications in which a small shift in the resonant frequency is linked to a tip-sample force. The addition of the tip-sample force also breaks the symmetry of the QTF leading to a classic eigenvalue veering scenario. The eigenvalue veering and accompanying mode localization phenomena violate the standard DAFM modeling assumptions which treat the addition of the tip-sample force as a small perturbation to a single-degree-of-freedom oscillator. We find that the eigenvalue veering can contribute a systematic error in force measurements on the order of 20%. Methodology for correcting the systematic error caused by eigenvalue veering is proposed.

Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB08 ◽  
Author(s):  
Takashi Ichii ◽  
Motohiko Fujimura ◽  
Masahiro Negami ◽  
Kuniaki Murase ◽  
Hiroyuki Sugimura
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Frequency Modulation ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

2014 ◽  
Vol 105 (4) ◽  
pp. 043107 ◽  
Author(s):  
Hiroaki Ooe ◽  
Tatsuya Sakuishi ◽  
Makoto Nogami ◽  
Masahiko Tomitori ◽  
Toyoko Arai
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document