Vibrational cooling in a cold ion trap: Vibrationally resolved photoelectron spectroscopy of cold C60− anions

2005 ◽  
Vol 123 (5) ◽  
pp. 051106 ◽  
Author(s):  
Xue-Bin Wang ◽  
Hin-Koon Woo ◽  
Lai-Sheng Wang
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Trap ◽  
Vibrational Cooling

scholarly journals Laboratory Studies of Ion Chemistry in the Interstellar Medium

2013 ◽  
Vol 9 (S297) ◽  
pp. 258-264 ◽  
Author(s):  
V. M. Bierbaum
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Trap ◽  
Experimental Studies ◽  
Negative Ions ◽  
Carbon Chain ◽  
Ion Chemistry ◽  
Ion Flow ◽  
Polycyclic Aromatic ◽  
Selected Ion Flow Tube ◽  
Gas Phase Ion

AbstractStudies of gas phase ion-neutral reactions provide insight into many areas of astrochemistry, including the elusive characterization of the Diffuse Interstellar Bands (DIBs). This presentation gives an overview of our experimental studies of several classes of positive and negative ions, using the flowing afterglow-selected ion flow tube and a newly modified ion trap. Earlier studies of carbon chain anions and polycyclic aromatic hydrocarbon (PAH) cations, both of which have been suggested as carriers of the DIBs, are described. More recent work including isomeric PAHs, nitrogen-containing PAHs, negative ions of PAHs, and negative ions of 5-membered heterocyclic rings are discussed. Finally, the study of quantitative thermochemistry by coupling our results with data from Photoelectron Spectroscopy is described.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

1990 ◽  
Vol 48 (2) ◽  
pp. 388-389
Author(s):  
A. M. Bradshaw
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Reactivity ◽  
Target Material ◽  
Orbital Energy ◽  
Light Sources ◽  
Analytical Technique ◽  
Hartree Fock ◽  
Spatially Resolved ◽  
Koopmans Theorem ◽  
Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Two dimensional Sr silicate grown on Si(001) studied using X-ray Photoelectron Spectroscopy

2006 ◽  
Vol 132 ◽  
pp. 87-90
Author(s):  
M. El Kazzi ◽  
G. Delhaye ◽  
S. Gaillard ◽  
E. Bergignat ◽  
G. Hollinger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Two Dimensional ◽  
X Ray

BONDS IN AMORPHOUS Nb1-xSixSTUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1025-C9-1028 ◽  
Author(s):  
W. ZAHOROWSKI ◽  
A. SIMUNEK ◽  
G. WIECH ◽  
K. SÖLDNER ◽  
R. KNAUF ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray
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