Magnetoelectric effect in hybrid magnetostrictive-piezoelectric composites in the electromechanical resonance region

2005 ◽  
Vol 97 (11) ◽  
pp. 113910 ◽  
Author(s):  
D. A. Filippov ◽  
M. I. Bichurin ◽  
C. W. Nan ◽  
J. M. Liu
Author(s):  
В.М. Лалетин ◽  
Д.А. Филиппов ◽  
Н.Н. Поддубная ◽  
И.Н. Маничева ◽  
G. Srinivasan

AbstractThe experimental frequency and field dependences of the magnetoelectric effect in three-layer permendur–quartz–permendur structures in the region of electromechanical resonance were studied. It was found that the magnetoelectric voltage coefficient and the Q-factor of these structures in the resonance region are much higher than those of similar structures based on lead zirconate titanate. Anomalous behavior of the field dependences of the magnetoelectric voltage coefficient and the Q-factor was observed in the region of electromechanical resonance. This feature is attributable to the negative Δ E effect.


2015 ◽  
Vol 233-234 ◽  
pp. 353-356
Author(s):  
Roman V. Petrov ◽  
Alexander S. Tatarenko ◽  
Vladimir M. Petrov ◽  
Mirza I. Bichurin

This manuscript is devoted to the magnetoelectric coupling in a dimensionally graded magnetostrictive-piezoelectric structure in the electromechanical resonance region. Theoretical frequency dependence of ME voltage coefficient is obtained. Theoretical estimates for the layered structure of lead zirconate-titanate and single-crystal Zn0,3Ni0,7Fe2O4 are in satisfactory agreement with data. The obtained results are expected to facilitate observation of enhanced ME coupling at overlapping of electromechanical and magnetic resonance due to energy transfer between spin waves and phonons.


2019 ◽  
Vol 45 (5) ◽  
pp. 436-438 ◽  
Author(s):  
V. M. Laletin ◽  
D. A. Filippov ◽  
N. N. Poddubnaya ◽  
I. N. Manicheva ◽  
G. Srinivasan

2012 ◽  
Vol 111 (12) ◽  
pp. 124513 ◽  
Author(s):  
Yaojin Wang ◽  
Davresh Hasanyan ◽  
Menghui Li ◽  
Junqi Gao ◽  
Jiefang Li ◽  
...  

2021 ◽  
Vol 2052 (1) ◽  
pp. 012042
Author(s):  
O V Sokolov ◽  
M I Bichurin ◽  
V S Leontiev

Abstract The article is devoted to a comparative theoretical study of the frequencies of the electromechanical resonance (EMR) of the magnetoelectric (ME) effect in the magnetostrictive-piezosemiconductor structure Metglas / GaAs of the longitudinal-shear and torsional modes. It is found that the resonance frequencies for the torsional mode are approximately 2 times higher than the corresponding frequencies for the longitudinal-shear mode. Therefore, it is quite possible to observe the torsional mode of the ME effect against the background of the longitudinal-shear mode, since the resonance frequencies are well distinguishable. The results obtained can find application in the construction of new ME devices.


Sensors ◽  
2020 ◽  
Vol 20 (24) ◽  
pp. 7142
Author(s):  
Mirza I. Bichurin ◽  
Roman V. Petrov ◽  
Viktor S. Leontiev ◽  
Oleg V. Sokolov ◽  
Andrei V. Turutin ◽  
...  

The article is devoted to the theoretical and experimental study of a magnetoelectric (ME) current sensor based on a gradient structure. It is known that the use of gradient structures in magnetostrictive-piezoelectric composites makes it possible to create a self-biased structure by replacing an external magnetic field with an internal one, which significantly reduces the weight, power consumption and dimensions of the device. Current sensors based on a gradient bidomain structure LiNbO3 (LN)/Ni/Metglas with the following layer thicknesses: lithium niobate—500 μm, nickel—10 μm, Metglas—29 μm, operate on a linear section of the working characteristic and do not require the bias magnetic field. The main characteristics of a contactless ME current sensor: its current range measures up to 10 A, it has a sensitivity of 0.9 V/A, its current consumption is not more than 2.5 mA, and its linearity is maintained to an accuracy of 99.8%. Some additional advantages of a bidomain lithium niobate-based current sensor are the increased sensitivity of the device due to the use of the bending mode in the electromechanical resonance region and the absence of a lead component in the device.


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