Crystalline orientation dependence of nanomechanical properties of Pb(Zr0.52Ti0.48)O3 thin films

2005 ◽  
Vol 86 (16) ◽  
pp. 162903 ◽  
Author(s):  
Qing-Ming Wang ◽  
Yongping Ding ◽  
Qingming Chen ◽  
Minhua Zhao ◽  
Jinrong Cheng
Keyword(s):  
Thin Films ◽  
Orientation Dependence ◽  
Crystalline Orientation ◽  
Nanomechanical Properties

Structural and Nanomechanical Properties of Cu (InxGa1–x)Se2 Thin Films Fabricated by One-Step Sputtering

JOM ◽  
2021 ◽  
Author(s):  
Talaat A. Hameed ◽  
Md Abdullah A. Mamun ◽  
Wei Cao ◽  
Hani E. Elsayed-Ali ◽  
Abdelmageed A. Elmustafa
Keyword(s):  
Thin Films ◽  
Nanomechanical Properties ◽  
One Step

Characterization of Epitaxial Superconducting YBacuO Thin Films with Three Different Orientations

1989 ◽  
Vol 169 ◽  
Author(s):  
X.K. Wang ◽  
D.X. Li ◽  
S.N. Song ◽  
J.Q. Zheng ◽  
R.P.H. Chang ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Orientation Dependence ◽  
Zero Field ◽  
Epitaxial Thin Films ◽  
Oriented Film ◽  
Zero Resistance ◽  
Xrd Patterns

AbstractEpitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.

Orientation Dependence of Critical Currents in a-Axis Oriented YBCO Thin Films

1990 ◽  
pp. 535-538
Author(s):  
X. K. Wang ◽  
D. X. Li ◽  
S. N. Song ◽  
J. Q. Zheng ◽  
R. P. H. Chang ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Currents ◽  
Orientation Dependence ◽  
Ybco Thin Films

Investigation of the Crystal Structure on the Nanomechanical Properties of Pulsed Laser Deposited NbN Thin Films

2012 ◽  
pp. 715-722
Author(s):  
M. A. Mamun ◽  
A. H. Farha ◽  
Y. Ufuktepe ◽  
H. E. Elsayed-Ali ◽  
A. A. Elmustafa
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Pulsed Laser ◽  
Nanomechanical Properties

Orientation dependence of electrical properties of polycrystalline Cu2O thin films

2020 ◽  
Vol 35 (7) ◽  
pp. 075016
Author(s):  
Miguel Tibério ◽  
Tomás Calmeiro ◽  
Suman Nandy ◽  
Daniela Nunes ◽  
Rodrigo Martins ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Orientation Dependence ◽  
Cu2o Thin Films

Carbon based Si- and Cr-containing thin films: Chemical and nanomechanical properties

2009 ◽  
Vol 11 (10) ◽  
pp. 1788-1792 ◽  
Author(s):  
I. Bertóti ◽  
M. Mohai ◽  
K. Kereszturi ◽  
A. Tóth ◽  
E. Kálmán
Keyword(s):  
Thin Films ◽  
Nanomechanical Properties ◽  
Carbon Based
Sign in / Sign up

Export Citation Format

Share Document