Influence of stoichiometry of direct plasma-enhanced chemical vapor deposited SiNx films and silicon substrate surface roughness on surface passivation
The effect of substrate surface roughness on the fracture toughness of Cu/96.5Sn-3.5Ag solder joints
1994 ◽
Vol 23
(10)
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pp. 1047-1053
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Keyword(s):
2010 ◽
Vol 69
(4)
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pp. 455-462
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Keyword(s):
2002 ◽
Vol 16
(06n07)
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pp. 952-957
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2004 ◽
Vol 39
(14)
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pp. 4669-4670
◽
1996 ◽
Vol 43
(3)
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pp. 266-273
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Keyword(s):
2006 ◽
Vol 15
(1)
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pp. 55-60
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