Tapping mode quartz crystal resonator based scanning force microscopy

Yongho Seo; Wonho Jhe

doi:10.1063/1.1832292

Tapping mode quartz crystal resonator based scanning force microscopy

Review of Scientific Instruments ◽

10.1063/1.1832292 ◽

2005 ◽

Vol 76 (1) ◽

pp. 016106 ◽

Cited By ~ 1

Author(s):

Yongho Seo ◽

Wonho Jhe

Keyword(s):

Quartz Crystal ◽

Scanning Force Microscopy ◽

Quartz Crystal Resonator ◽

Tapping Mode ◽

Force Microscopy ◽

Crystal Resonator ◽

Scanning Force

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Scanning localized viscoelastic image using a quartz crystal resonator combined with an atomic force microscopy

Applied Physics Letters ◽

10.1063/1.123033 ◽

1999 ◽

Vol 74 (3) ◽

pp. 466-468 ◽

Cited By ~ 22

Author(s):

Jong Min Kim ◽

Sang Mok Chang ◽

Hiroshi Muramatsu

Keyword(s):

Atomic Force Microscopy ◽

Quartz Crystal ◽

Quartz Crystal Resonator ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Resonator

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Specific Adhesion of Vesicles Monitored by Scanning Force Microscopy and Quartz Crystal Microbalance

Biophysical Journal ◽

10.1016/s0006-3495(00)76611-2 ◽

2000 ◽

Vol 78 (1) ◽

pp. 487-498 ◽

Cited By ~ 70

Author(s):

Bruno Pignataro ◽

Claudia Steinem ◽

Hans-Joachim Galla ◽

Harald Fuchs ◽

Andreas Janshoff

Keyword(s):

Quartz Crystal Microbalance ◽

Quartz Crystal ◽

Scanning Force Microscopy ◽

Force Microscopy ◽

Scanning Force

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Experimental evaluation of probe-sample force in tapping mode scanning force microscopy

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199905/06)27:5/6<374::aid-sia535>3.0.co;2-s ◽

1999 ◽

Vol 27 (5-6) ◽

pp. 374-378 ◽

Cited By ~ 2

Author(s):

S. Matlis ◽

R. Edgar

Keyword(s):

Experimental Evaluation ◽

Scanning Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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High-Resolution Chemical Mapping of Surface Bound Functional Groups with Tapping-Mode Scanning Force Microscopy

Journal of the American Chemical Society ◽

10.1021/ja971474+ ◽

1997 ◽

Vol 119 (36) ◽

pp. 8564-8565 ◽

Cited By ~ 27

Author(s):

Michael O. Finot ◽

Mark T. McDermott

Keyword(s):

High Resolution ◽

Functional Groups ◽

Scanning Force Microscopy ◽

Chemical Mapping ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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Tapping-mode scanning force microscopy: Metallic tips and samples

Computational Materials Science ◽

10.1016/0927-0256(96)00003-1 ◽

1996 ◽

Vol 5 (4) ◽

pp. 291-297 ◽

Cited By ~ 9

Author(s):

Dror Sarid

Keyword(s):

Scanning Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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Tip-sample interaction in tapping-mode scanning force microscopy

Physical Review B ◽

10.1103/physrevb.61.14179 ◽

2000 ◽

Vol 61 (20) ◽

pp. 14179-14183 ◽

Cited By ~ 40

Author(s):

P. J. de Pablo ◽

J. Colchero ◽

M. Luna ◽

J. Gómez-Herrero ◽

A. M. Baró

Keyword(s):

Scanning Force Microscopy ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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Ultrasonic micromachining on Al thin film using atomic force microscopy combined quartz crystal resonator

Thin Solid Films ◽

10.1016/s0040-6090(96)09567-3 ◽

1997 ◽

Vol 302 (1-2) ◽

pp. 122-126 ◽

Cited By ~ 6

Author(s):

Futoshi Iwata ◽

Makoto Kawaguchi ◽

Hisayuki Aoyama ◽

Akira Sasaki

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Quartz Crystal ◽

Quartz Crystal Resonator ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Resonator ◽

Al Thin Film

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Surface track formation on mica surfaces due to grazing incidence 20.2 MeV C60 ions: a comparative study employing shadow-replica electron microscopy, tapping-mode and phase-imaging scanning force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(98)00640-5 ◽

1999 ◽

Vol 149 (1-2) ◽

pp. 119-128 ◽

Cited By ~ 10

Author(s):

J. Herbig ◽

C.T. Reimann ◽

M. Bergqvist ◽

S. Oscarsson ◽

I.V. Vorobyova

Keyword(s):

Electron Microscopy ◽

Comparative Study ◽

Scanning Force Microscopy ◽

Grazing Incidence ◽

Phase Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Track Formation ◽

Scanning Force

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Surface defect formation on gypsum surfaces due to grazing incidence 78.2 MeV 127I ions: A comparative study employing tapping-mode scanning force microscopy and shadow-replica electron microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(96)00826-9 ◽

1997 ◽

Vol 122 (2) ◽

pp. 255-261 ◽

Cited By ~ 15

Author(s):

D.A. Kolesnikov ◽

C.T. Reimann ◽

I.V. Vorobyova

Keyword(s):

Electron Microscopy ◽

Comparative Study ◽

Surface Defect ◽

Defect Formation ◽

Scanning Force Microscopy ◽

Grazing Incidence ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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Vertical dimension of hydrated biological samples in tapping mode scanning force microscopy

Biophysical Journal ◽

10.1016/s0006-3495(96)79713-8 ◽

1996 ◽

Vol 70 (3) ◽

pp. 1514-1520 ◽

Cited By ~ 18

Author(s):

F.A. Schabert ◽

J.P. Rabe

Keyword(s):

Biological Samples ◽

Scanning Force Microscopy ◽

Vertical Dimension ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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