High-resolution synchrotron-radiation photoemission characterization for atomically-controlled SrTiO3(001) substrate surfaces subjected to various surface treatments

2004 ◽  
Vol 96 (12) ◽  
pp. 7183-7188 ◽  
Author(s):  
D. Kobayashi ◽  
H. Kumigashira ◽  
M. Oshima ◽  
T. Ohnishi ◽  
M. Lippmaa ◽  
...  
1989 ◽  
Vol 161 ◽  
Author(s):  
Xiaohua Yu ◽  
N. Troullier ◽  
A. Raisanen ◽  
G. Haugstad ◽  
A. Franciosi

ABSTRACTWe have conducted a systematic study of Ge-Cd1−xMnxTe heterostructures prepared in situ by deposition of polycrystalline Ge onto atomically clean Cd1−xMnx (110) surfaces. We examined by means of high resolution synchrotron radiation photoemission the valence band offset δEv as a function of the substrate composition x (x=0, 0.35, and 0.60) and bandgap Eg (Eg = 1.47, 1.93, and 2.13 eV). We find δEv=0.84±0.10eV in all cases, and no dependence of δEv on the substrate bandgap within experimental uncertainty. This finding indicates that within the range of validity of the transitivity rule, Cd1−xMnx-Cd1−yMny heterojunctions may actually follow the common anion rule.


2002 ◽  
Vol 09 (02) ◽  
pp. 1229-1233 ◽  
Author(s):  
S. B. WHITFIELD ◽  
R. WEHLITZ ◽  
M. O. KRAUSE ◽  
C. D. CALDWELL

Using the technique of photoelectron spectrometry in conjunction with synchrotron radiation, we have carried out a systematic study of the partial cross sections of the main photoelectron lines arising from the ionization of the 3d and 4s subshells of atomic Fe in the vicinity of 3p → 3d autoionizing resonances. Our results confirm the presence of two broad and intense resonances which have been observed earlier. However, our high resolution results also clearly indicate the presence of numerous other weaker resonances. Through a fitting procedure we were able to accurately determine both resonance widths and positions.


2012 ◽  
Author(s):  
J. Barros ◽  
L. Manceron ◽  
J.-B. Brubach ◽  
C. Evain ◽  
M.-E. Couprie ◽  
...  

1998 ◽  
Vol 58 (7) ◽  
pp. 4149-4155 ◽  
Author(s):  
Tun-Wen Pi ◽  
Ie-Hong Hong ◽  
Chiu-Ping Cheng

2005 ◽  
Vol 86 (7) ◽  
pp. 071915 ◽  
Author(s):  
L. Helfen ◽  
T. Baumbach ◽  
P. Mikulík ◽  
D. Kiel ◽  
P. Pernot ◽  
...  

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.


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