Dopant profiling in vertical ultrathin channels of double-gate metal–oxide–semiconductor field-effect transistors by using scanning nonlinear dielectric microscopy
2005 ◽
Vol 44
(4B)
◽
pp. 2400-2404
◽
2009 ◽
Vol 96
(10)
◽
pp. 1023-1038
2002 ◽
Vol 41
(Part 2, No. 10A)
◽
pp. L1096-L1098
◽
1993 ◽
Vol 32
(Part 1, No. 11A)
◽
pp. 4916-4922
◽
2011 ◽
Vol 50
(4S)
◽
pp. 04DC14
◽
2010 ◽
Vol 5
(1)
◽
pp. 43-49
Keyword(s):
2007 ◽
Vol 46
(6A)
◽
pp. 3283-3290
◽