Dopant profiling in vertical ultrathin channels of double-gate metal–oxide–semiconductor field-effect transistors by using scanning nonlinear dielectric microscopy

2004 ◽  
Vol 85 (18) ◽  
pp. 4139-4141 ◽  
Author(s):  
Meishoku Masahara ◽  
Shinichi Hosokawa ◽  
Takashi Matsukawa ◽  
Kazuhiko Endo ◽  
Yuuichi Naitou ◽  
...  
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