Transmission Electron Microscopy evidence of the growth of a magnetite layer acting as a spin filter in CoFe∕Al2O3∕CoFe magnetic tunnel junctions

2004 ◽  
Vol 96 (6) ◽  
pp. 3307-3311 ◽  
Author(s):  
E. Snoeck ◽  
V. Serin ◽  
R. Fourmeaux ◽  
Z. Zhang ◽  
P. P. Freitas
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Spin Filter ◽  
Magnetite Layer ◽  
Transmission Electron

scholarly journals Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited CoFeB/MgO/CoFeB Magnetic Tunnel Junctions with Tantalum Capping Layer

2011 ◽  
Vol 17 (S2) ◽  
pp. 1860-1861
Author(s):  
R Petrova ◽  
R Ferreira ◽  
S Cardoso ◽  
P Freitas ◽  
S McVitie ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Ion Beam ◽  
Magnetic Tunnel Junctions ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Capping Layer ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals MnMn/O Interface Termination at the Co2MnαSi/MgO Interface in Magnetic Tunnel Junctions Investigated by Scanning Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 336-337
Author(s):  
F. Shi ◽  
H. Liu ◽  
M. Yamamoto ◽  
P.M. Voyles
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Characterization of interfacial reactions in magnetite tunnel junctions with transmission electron microscopy

2004 ◽  
Vol 95 (11) ◽  
pp. 6798-6800 ◽  
Author(s):  
Yingguo Peng ◽  
Chando Park ◽  
Jian-Gang Zhu ◽  
Robert M. White ◽  
David E. Laughlin
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tunnel Junctions ◽  
Interfacial Reactions ◽  
Transmission Electron
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