Optical properties of nanocrystalline silicon within silica gel monoliths

2004 ◽  
Vol 96 (4) ◽  
pp. 2240-2243 ◽  
Author(s):  
Y. Posada ◽  
L. San Miguel ◽  
L. F. Fonseca ◽  
O. Resto ◽  
S. Z. Weisz ◽  
...  
Keyword(s):  
Optical Properties ◽  
Silica Gel ◽  
Nanocrystalline Silicon ◽  
Silica Gel Monoliths

Optical properties of Co2+-doped silica gel monoliths

1994 ◽  
Vol 176 (2-3) ◽  
pp. 172-178 ◽  
Author(s):  
A Boos ◽  
G Pourroy ◽  
J.L Rehspringer ◽  
J.L Guille
Keyword(s):  
Optical Properties ◽  
Silica Gel ◽  
Silica Gel Monoliths

scholarly journals Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD

2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
S. Ktifa ◽  
M. Ghrib ◽  
F. Saadallah ◽  
H. Ezzaouia ◽  
N. Yacoubi
Keyword(s):  
Optical Properties ◽  
Energy Gap ◽  
Chemical Vapor ◽  
Nanocrystalline Silicon ◽  
Porous Aluminum ◽  
Force Microscopy ◽  
Photothermal Deflection Spectroscopy ◽  
Atomic Force ◽  
Photothermal Deflection ◽  
Morphology Characterization

We have studied the optical properties of nanocrystalline silicon (nc-Si) film deposited by plasma enhancement chemical vapor deposition (PECVD) on porous aluminum structure using, respectively, the Photothermal Deflection Spectroscopy (PDS) and Photoluminescence (PL). The aim of this work is to investigate the influence of anodisation current on the optical properties of the porous aluminum silicon layers (PASL). The morphology characterization studied by atomic force microscopy (AFM) technique has shown that the grain size of (nc-Si) increases with the anodisation current. However, a band gap shift of the energy gap was observed.

scholarly journals Comparison of Optical Properties of Eu3+Ions in the Silica Gel Glasses Obtained by Different Preparation Techniques

1996 ◽  
Vol 90 (2) ◽  
pp. 461-468 ◽  
Author(s):  
J. Legendziewicz ◽  
W. Stręk ◽  
J. Sokolnicki ◽  
B. Keller ◽  
M. Borzechowska
Keyword(s):  
Optical Properties ◽  
Silica Gel ◽  
Gel Glasses ◽  
Preparation Techniques

Optical properties and crystallinity of hydrogenated nanocrystalline silicon (nc-Si:H) thin films deposited by rf-PECVD

Vacuum ◽  
2012 ◽  
Vol 86 (8) ◽  
pp. 1195-1202 ◽  
Author(s):  
Goh Boon Tong ◽  
Zarina Aspanut ◽  
Muhamad Rasat Muhamad ◽  
Saadah Abdul Rahman
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Nanocrystalline Silicon
Sign in / Sign up

Export Citation Format

Share Document