High-resolution X-ray Microdiffraction System for Characterization of Selectively Grown Layers using a Zone Plate Combined with a Narrow Slit

2004 ◽  
Author(s):  
Shigeru Kimura
Keyword(s):  
High Resolution ◽  
Zone Plate ◽  
Narrow Slit ◽  
X Ray

HIGH RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES

1984 ◽  
Vol 45 (C2) ◽  
pp. C2-77-C2-81 ◽  
Author(s):  
G. Schmahl ◽  
D. Rudolph ◽  
B. Niemann
Keyword(s):  
High Resolution ◽  
Zone Plate ◽  
X Ray

Three dimensional characterization of laser ablation craters using high resolution X-ray computed tomography

2018 ◽  
Vol 139 ◽  
pp. 75-82 ◽  
Author(s):  
A.H. Galmed ◽  
A. du Plessis ◽  
S.G. le Roux ◽  
E. Hartnick ◽  
H. Von Bergmann ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Laser Ablation ◽  
High Resolution ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Computed

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

High Resolution X-Ray Characterization of Sub-Micron Periodic Domain Structures in Lithium Niobate Crystals

2007 ◽  
Vol 352 (1) ◽  
pp. 25-34 ◽  
Author(s):  
M. Bazzan ◽  
N. Argiolas ◽  
C. Sada ◽  
P. Mazzoldi ◽  
S. Grilli ◽  
...  
Keyword(s):  
High Resolution ◽  
Lithium Niobate ◽  
Periodic Domain ◽  
X Ray ◽  
Domain Structures ◽  
Lithium Niobate Crystals

X-ray topo-tomography studies of linear dislocations in silicon single crystals

2018 ◽  
Vol 51 (6) ◽  
pp. 1616-1622 ◽  
Author(s):  
Victor Asadchikov ◽  
Alexey Buzmakov ◽  
Felix Chukhovskii ◽  
Irina Dyachkova ◽  
Denis Zolotov ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
High Resolution ◽  
Single Crystals ◽  
Complete Characterization ◽  
Reconstruction Technique ◽  
Algebraic Reconstruction Technique ◽  
X Ray ◽  
Laboratory Setup ◽  
Simultaneous Algebraic Reconstruction Technique

This article describes complete characterization of the polygonal dislocation half-loops (PDHLs) introduced by scratching and subsequent bending of an Si(111) crystal. The study is based on the X-ray topo-tomography technique using both a conventional laboratory setup and the high-resolution X-ray image-detecting systems at the synchrotron facilities at KIT (Germany) and ESRF (France). Numerical analysis of PDHL images is performed using the Takagi–Taupin equations and the simultaneous algebraic reconstruction technique (SART) tomographic algorithm.

High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films

2006 ◽  
Vol 252 (15) ◽  
pp. 5602-5606 ◽  
Author(s):  
J.J. Kim ◽  
E. Ikenaga ◽  
M. Kobata ◽  
A. Takeuchi ◽  
M. Awaji ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Thin Solid Films ◽  
X Ray ◽  
Solid Films ◽  
Essential Tool

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures

1997 ◽  
pp. 439-448 ◽  
Author(s):  
A. Sanz-Hervás ◽  
C. Villar ◽  
M. Aguilar ◽  
A. Sacedón ◽  
J. L. Sánchez-Rojas ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray Diffraction ◽  
X Ray
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