Two Pressure Induced Phase Transitions in Triglycine Sulfate

1959 ◽  
Vol 31 (3) ◽  
pp. 856-856 ◽  
Author(s):  
H. L. Suchan ◽  
H. G. Drickamer
Keyword(s):  
Phase Transitions ◽  
Triglycine Sulfate

Comparative study of the effect of low-dose gamma irradiation on phase transitions in single crystals of triglycine sulfate and its deuterated analog

2006 ◽  
Vol 48 (6) ◽  
pp. 1090-1093 ◽  
Author(s):  
V. A. Fedorikhin ◽  
B. A. Strukov ◽  
S. A. Taraskin ◽  
I. V. Shnaĭdshteĭn ◽  
S. T. Davitadze
Keyword(s):  
Phase Transitions ◽  
Comparative Study ◽  
Gamma Irradiation ◽  
Single Crystals ◽  
Low Dose ◽  
Triglycine Sulfate ◽  
Deuterated Analog

Electron Microscopy of Graphite Intercalation Compounds

1982 ◽  
Vol 40 ◽  
pp. 544-545
Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Domain Wall ◽  
Intercalation Compounds ◽  
Lattice Plane ◽  
Wall Model ◽  
Graphite Intercalation Compounds ◽  
Fundamental Symmetry ◽  
Graphite Intercalation

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.

Multiple phase transitions investigated by high-speed TEM

1990 ◽  
Vol 48 (4) ◽  
pp. 550-551
Author(s):  
Oleg Bostanjoglo ◽  
Peter Thomsen-Schmidt
Keyword(s):  
Phase Transitions ◽  
High Speed ◽  
Short Exposure ◽  
Semiconductor Film ◽  
Time Resolved ◽  
Short Exposure Time ◽  
Multiple Phase ◽  
Model Substance ◽  
History Of ◽  
Electron Image

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)

Evolution of Phase Transitions

2006 ◽  
Author(s):  
Rohan Abeyaratne ◽  
James K. Knowles
Keyword(s):  
Phase Transitions

Phase Transitions in Machine Learning

2009 ◽  
Author(s):  
Lorenza Saitta ◽  
Attilio Giordana ◽  
Antoine Cornuejols
Keyword(s):  
Machine Learning ◽  
Phase Transitions
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