Crossed‐Molecular‐Beam Measurements of the Total Cross Sections of Ar–N2, Ar–Ne, Ar–He, and Ar–H2 at Thermal Energies

1966 ◽  
Vol 45 (1) ◽  
pp. 240-248 ◽  
Author(s):  
R. W. Landorf ◽  
C. R. Mueller
Keyword(s):  
Cross Sections ◽  
Molecular Beam ◽  
Total Cross Sections ◽  
Crossed Molecular Beam

Intermolecular Potentials from Differential Cross Sections: Ar + Ar

1972 ◽  
Vol 50 (6) ◽  
pp. 892-896 ◽  
Author(s):  
Ferenc Kalos ◽  
Arthur E. Grosser
Keyword(s):  
Cross Sections ◽  
Differential Cross ◽  
Molecular Beam ◽  
Spectroscopic Constants ◽  
Differential Cross Sections ◽  
Jones Potential ◽  
Total Cross Sections ◽  
Lennard Jones ◽  
The One ◽  
Beam Technique

The angular distribution of Ar + Ar scattering at E = 9.16 × 10−14 erg was measured out to the rainbow pattern (supernumerary rainbow and part of the rainbow peak) by the crossed molecular beam technique, with mass spectrometric detection. This distribution was compared to calculated differential cross sections. Total cross sections, and spectroscopic constants for Ar2 were also calculated. The trial potentials were L.J.-12,6, LJ.-20,6, a modified Lennard–Jones potential (L.J.-14,12,8,6) and the Bobetic–Barker potential. The Bobetic–Barker potential is the one most consistent with cross section and spectroscopic experiments.

Analysis of STEM micrographs of thick objects

1978 ◽  
Vol 36 (2) ◽  
pp. 106-107
Author(s):  
S. Golladay
Keyword(s):  
Inelastic Scattering ◽  
Multiple Scattering ◽  
Mass Distribution ◽  
Cross Sections ◽  
Phase Contrast ◽  
Image Point ◽  
Contrast Effects ◽  
Total Cross Sections ◽  
Elastic And Inelastic Scattering

The theory of multiple scattering has been worked out by Groves and comparisons have been made between predicted and observed signals for thick specimens observed in a STEM under conditions where phase contrast effects are unimportant. Independent measurements of the collection efficiencies of the two STEM detectors, calculations of the ratio σe/σi = R, where σe, σi are the total cross sections for elastic and inelastic scattering respectively, and a model of the unknown mass distribution are needed for these comparisons. In this paper an extension of this work will be described which allows the determination of the required efficiencies, R, and the unknown mass distribution from the data without additional measurements or models. Essential to the analysis is the fact that in a STEM two or more signal measurements can be made simultaneously at each image point.

scholarly journals Total cross sections of eγ → $$ eX\overline{X} $$ processes with X = μ, γ, e via multiloop methods

2021 ◽  
Vol 2021 (1) ◽  
Author(s):  
Roman N. Lee ◽  
Alexey A. Lyubyakin ◽  
Vyacheslav A. Stotsky
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Elliptic Integral ◽  
High Energy ◽  
Calculation Methods ◽  
Complete Elliptic Integral ◽  
Total Cross Sections ◽  
Multiloop Calculation ◽  
The Cross ◽  
Analytical Expressions

Abstract Using modern multiloop calculation methods, we derive the analytical expressions for the total cross sections of the processes e−γ →$$ {e}^{-}X\overline{X} $$ e − X X ¯ with X = μ, γ or e at arbitrary energies. For the first two processes our results are expressed via classical polylogarithms. The cross section of e−γ → e−e−e+ is represented as a one-fold integral of complete elliptic integral K and logarithms. Using our results, we calculate the threshold and high-energy asymptotics and compare them with available results.

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