Cathodoluminescence Detector for the Applied Research Laboratories Electron Microprobe

1967 ◽  
Vol 38 (6) ◽  
pp. 837-838 ◽  
Author(s):  
E. J. Saller
Keyword(s):  
Electron Microprobe ◽  
Applied Research

Interrelationships of Sample Composition, Backscatter Coefficient, and Target Current Measurement

1963 ◽  
Vol 7 ◽  
pp. 325-339 ◽  
Author(s):  
Kurt F. J. Heinrich
Keyword(s):  
Quantitative Analysis ◽  
Electron Microprobe ◽  
Applied Research ◽  
Current Measurement ◽  
Backscatter Coefficient ◽  
Sample Composition ◽  
Concentration Mapping

AbstractThe use of target current measurements in the electron microprobe for quantitative analysis of binary samples has been proposed by several authors. However, the equations proposed for calculations as well as instrumental conditions differ considerably. The present paper relates the target current measurements made with the Applied Research Laboratories microprobe to the backscatter coefficients determined independently. Equations for analyzing binary samples as well as applications to line scans and concentration mapping are given.

A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe

1965 ◽  
Vol 9 ◽  
pp. 420-429
Author(s):  
J. B. Nicholson ◽  
M. F. Hasler
Keyword(s):  
Fatty Acid ◽  
Electron Microprobe ◽  
Applied Research ◽  
Grazing Incidence ◽  
X Rays ◽  
Output Intensity ◽  
Standard Equipment ◽  
Background Ratio ◽  
Grating Spectrometer ◽  
Peak Intensity

AbstractThe importance of operating within the blaze angle is emphasized by a series of measurements of ultrasoft X-rays obtained with a new grazing-incidence, grating spectrometer, A formula to maximize output intensity has been derived which predicts a variation of input angle with changes of wavelength. The spectrometer is designed to utilize this function. The grating spectrometer was installed into an Applied Research Laboratories Analyst's Microprobe. Since the AMX furnishes an utt.rasoft spectrometer with a fatty acid pseudocrystal as standard equipment, it is possible to compare the two systems simultaneously on the same sample at the same wavelength. The grating and crystal systems are compared for peak intensity and line-to-background ratio.

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

Study of the resistor material of an automotive spark plug by use of the charge-up effect along with elemental mapping in an electron microprobe

1991 ◽  
Vol 49 ◽  
pp. 742-743
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
J. S. Park ◽  
B. N. Juterbock
Keyword(s):  
Electron Microprobe ◽  
Present Report ◽  
Coated Sample ◽  
Valuable Insight ◽  
Elemental Mapping ◽  
Spark Plug ◽  
Carbon Coated ◽  
Electron Image ◽  
Electron Imaging ◽  
Insight Into

The electric and thermal properties of the resistor material in an automotive spark plug should be stable during its service lifetime. Containing many elements and many phases, this material has a very complex microstructure. Elemental mapping with an electron microprobe can reveal the distribution of all relevant elements throughout the sample. In this work, it is demonstrated that the charge-up effect, which would distort an electron image and, therefore, is normally to be avoided in an electron imaging work, could be used to advantage to reveal conductive and resistive zones in a sample. Its combination with elemental mapping can provide valuable insight into the underlying conductivity mechanism of the resistor.This work was performed in a CAMECA SX-50 microprobe. The spark plug used in the present report was a commercial product taken from the shelf. It was sectioned to expose the cross section of the resistor. The resistor was known not to contain the precious metal Au as checked on the carbon coated sample. The sample was then stripped of carbon coating and re-coated with Au.

Bence-albee after 25 years: A new superior α-factor correction procedure for the quantitative analysis of oxides and silicates

1992 ◽  
Vol 50 (2) ◽  
pp. 1744-1745
Author(s):  
John T. Armstrong
Keyword(s):  
Quantitative Analysis ◽  
Electron Microprobe ◽  
Binary Systems ◽  
Correction Procedure ◽  
Geological Samples ◽  
The Past ◽  
Large Matrix ◽  
Computational Speed ◽  
Microprobe Data ◽  
Geological Sciences

One of the most cited papers in the geological sciences has been that of Albee and Bence on the use of empirical " α -factors" to correct quantitative electron microprobe data. During the past 25 years this method has remained the most commonly used correction for geological samples, despite the facts that few investigators have actually determined empirical α-factors, but instead employ tables of calculated α-factors using one of the conventional "ZAF" correction programs; a number of investigators have shown that the assumption that an α-factor is constant in binary systems where there are large matrix corrections is incorrect (e.g, 2-3); and the procedure’s desirability in terms of program size and computational speed is much less important today because of developments in computing capabilities. The question thus exists whether it is time to honorably retire the Bence-Albee procedure and turn to more modern, robust correction methods. This paper proposes that, although it is perhaps time to retire the original Bence-Albee procedure, it should be replaced by a similar method based on compositiondependent polynomial α-factor expressions.

Long-term variations in individual particle types in the aerosol of Phoenix, Arizona, as determined using automated electron microprobe analysis and multivariate statistical techniques

1993 ◽  
Vol 51 ◽  
pp. 742-743
Author(s):  
Karen A. Katrinak ◽  
James R. Anderson ◽  
Peter R. Buseck
Keyword(s):  
Electron Microprobe ◽  
Fine Fraction ◽  
Coarse Fraction ◽  
Motor Vehicles ◽  
Multivariate Statistical Methods ◽  
Multivariate Statistical ◽  
X Ray ◽  
Mineral Particles ◽  
Anthropogenic Air Pollutants

Aerosol samples were collected in Phoenix, Arizona on eleven dates between July 1989 and April 1990. Elemental compositions were determined for approximately 1000 particles per sample using an electron microprobe with an energy-dispersive x-ray spectrometer. Fine-fraction samples (particle cut size of 1 to 2 μm) were analyzed for each date; coarse-fraction samples were also analyzed for four of the dates.The data were reduced using multivariate statistical methods. Cluster analysis was first used to define 35 particle types. 81% of all fine-fraction particles and 84% of the coarse-fraction particles were assigned to these types, which include mineral, metal-rich, sulfur-rich, and salt categories. "Zero-count" particles, consisting entirely of elements lighter than Na, constitute an additional category and dominate the fine fraction, reflecting the importance of anthropogenic air pollutants such as those emitted by motor vehicles. Si- and Ca-rich mineral particles dominate the coarse fraction and are also numerous in the fine fraction.

A Macintosh Interface for the Cameca Camebax-Micro Electron Microprobe

1990 ◽  
Vol 48 (1) ◽  
pp. 438-439
Author(s):  
Carl E. Henderson
Keyword(s):  
Electron Microprobe ◽  
Processing Speed ◽  
Word Processing ◽  
State Of The Art ◽  
Computer Control ◽  
Third Party ◽  
Disk Storage ◽  
The Past ◽  
User Facility ◽  
Instrument Control

Over the past few years it has become apparent in our multi-user facility that the computer system and software supplied in 1985 with our CAMECA CAMEBAX-MICRO electron microprobe analyzer has the greatest potential for improvement and updating of any component of the instrument. While the standard CAMECA software running on a DEC PDP-11/23+ computer under the RSX-11M operating system can perform almost any task required of the instrument, the commands are not always intuitive and can be difficult to remember for the casual user (of which our laboratory has many). Given the widespread and growing use of other microcomputers (such as PC’s and Macintoshes) by users of the microprobe, the PDP has become the “oddball” and has also fallen behind the state-of-the-art in terms of processing speed and disk storage capabilities. Upgrade paths within products available from DEC are considered to be too expensive for the benefits received. After using a Macintosh for other tasks in the laboratory, such as instrument use and billing records, word processing, and graphics display, its unique and “friendly” user interface suggested an easier-to-use system for computer control of the electron microprobe automation. Specifically a Macintosh IIx was chosen for its capacity for third-party add-on cards used in instrument control.

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