Sensitive 4 mm Lecher Wire Interferometer for Electron Concentration Measurements in Low‐Density Plasmas

1967 ◽  
Vol 38 (11) ◽  
pp. 1631-1633 ◽  
Author(s):  
J. Polman
Keyword(s):  
Electron Concentration ◽  
Low Density ◽  
Concentration Measurements

Electron concentration measurements in combustion MHD flows by submillimeter laser interferometry

1977 ◽  
Vol 1 (4) ◽  
pp. 206-211 ◽  
Author(s):  
S.A. Self ◽  
F.O. Reigel ◽  
R.M. Clements ◽  
R.K. James
Keyword(s):  
Electron Concentration ◽  
Laser Interferometry ◽  
Mhd Flows ◽  
Submillimeter Laser ◽  
Concentration Measurements

Results of electron-concentration measurements in the D-region of the ionosphere during ionospheric disturbances

1975 ◽  
Vol 18 (8) ◽  
pp. 806-809
Author(s):  
V. V. Belikovich ◽  
E. A. Benediktov ◽  
L. V. Grishkevich ◽  
V. A. Ivanov
Keyword(s):  
Electron Concentration ◽  
Ionospheric Disturbances ◽  
D Region ◽  
Concentration Measurements

Approximation of the electron concentration measurements in the middle ionosphere at low solar activity

2009 ◽  
Vol 49 (7) ◽  
pp. 1006-1010
Author(s):  
L. A. Shchepkin ◽  
G. M. Kuznetsova ◽  
G. P. Kushnarenko ◽  
K. G. Ratovsky
Keyword(s):  
Solar Activity ◽  
Electron Concentration ◽  
Concentration Measurements

Comparison of several probe techniques for ionospheric electron concentration measurements

1968 ◽  
Vol 73 (11) ◽  
pp. 3511-3535 ◽  
Author(s):  
W. J. Heikkila ◽  
N. Eaker ◽  
J. A. Fejer ◽  
K. R. Tipple ◽  
J. Hugill ◽  
...  
Keyword(s):  
Electron Concentration ◽  
Concentration Measurements

Application of Improved Voltage Compensation in the SEM to Imaging of Organic Materials

1973 ◽  
Vol 31 ◽  
pp. 444-445
Author(s):  
P.J. Killingworth ◽  
M. Warren
Keyword(s):  
Electron Beam ◽  
Organic Materials ◽  
Operating Parameters ◽  
Low Density ◽  
Beam Diameter ◽  
Incident Electron Beam ◽  
Specimen Material ◽  
Voltage Compensation ◽  
Selection Of ◽  
Scanning Electron

Ultimate resolution in the scanning electron microscope is determined not only by the diameter of the incident electron beam, but by interaction of that beam with the specimen material. Generally, while minimum beam diameter diminishes with increasing voltage, due to the reduced effect of aberration component and magnetic interference, the excited volume within the sample increases with electron energy. Thus, for any given material and imaging signal, there is an optimum volt age to achieve best resolution.In the case of organic materials, which are in general of low density and electric ally non-conducting; and may in addition be susceptible to radiation and heat damage, the selection of correct operating parameters is extremely critical and is achiev ed by interative adjustment.

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