Alpha Particle Energy Resolution in a Liquid Scintillator

1964 ◽  
Vol 35 (3) ◽  
pp. 334-340 ◽  
Author(s):  
Donald L. Horrocks
Keyword(s):  
Energy Resolution ◽  
Alpha Particle ◽  
Liquid Scintillator ◽  
Particle Energy ◽  
Alpha Particle Energy

INFLUENCE OF DUST LOADING ON THE ALPHA-PARTICLE ENERGY RESOLUTION OF CONTINUOUS AIR MONITORS FOR THIN DEPOSITS OF RADIOACTIVE AEROSOLS

2002 ◽  
Vol 83 (6) ◽  
pp. 884-891 ◽  
Author(s):  
Suilou Huang ◽  
Stephen D. Schery ◽  
Raul E. Alcantara ◽  
John C. Rodgers ◽  
Piotr T. Wasiolek
Keyword(s):  
Energy Resolution ◽  
Alpha Particle ◽  
Particle Energy ◽  
Radioactive Aerosols ◽  
Alpha Particle Energy ◽  
Dust Loading

Shell and odd-even effects on alpha-particle energy spectra from the (p,α) reaction on nuclei around neutron number 50

1987 ◽  
Vol 35 (2) ◽  
pp. 467-478 ◽  
Author(s):  
I. Kumabe ◽  
Y. Mito ◽  
M. Hyakutake ◽  
N. Koori ◽  
H. Sakai ◽  
...  
Keyword(s):  
Alpha Particle ◽  
Neutron Number ◽  
Particle Energy ◽  
Energy Spectra ◽  
Alpha Particle Energy

148Gd, 238U, 239Pu and 244Cm alpha particle energy analysis using tracks in solids

2001 ◽  
Vol 34 (1-6) ◽  
pp. 341-343 ◽  
Author(s):  
C Amero ◽  
J.I Golzarri ◽  
M Izerrouken ◽  
G Espinosa
Keyword(s):  
Alpha Particle ◽  
Energy Analysis ◽  
Particle Energy ◽  
Alpha Particle Energy

Determination of CR-39 and LR-115 Type II Mean Critical Angle of Etching Using a New Monte Carlo Code

2020 ◽  
Author(s):  
Hicham Harrass ◽  
Abdellatif Talbi ◽  
Rodouan Touti
Keyword(s):  
Monte Carlo ◽  
Alpha Particle ◽  
Critical Angle ◽  
Current Method ◽  
Particle Energy ◽  
Alpha Particles ◽  
Monte Carlo Code ◽  
Type Ii ◽  
Alpha Particle Energy ◽  
The Mean

Abstract CR-39 and LR-115 type II solid state nuclear track detectors (SSNTDs) are both used, in order to assess the concentration of nucleus belonging to 238U and 232Th series, these ones can be also used to measure radon 222Rn and thoron 220Rn gases in different locations. In this paper, a Monte Carlo code was developed to calculate the mean critical angle for which alpha particles emitted from 238U and 232Th families in studied material samples reach CR-39 and LR-115 type II surfaces and bring about latent tracks on them. The dependence of the SSNTDs mean critical angle on the removed thickness, the initial alpha particle energy has been studied. A linear relationship between CR-39 mean critical angle and the initial alpha particle energy for different removed thicknesses has been found. This straightforward relationship allows determining quickly the mean critical angle of etching which corresponds to initial alpha particle energy for a given removed thickness. CR-39 mean critical angle ranged from 59° for an alpha particle emitted by 212Po to 71° for an alpha particle emitted by 232Th, for the value of removed thickness of 6 µm; whereas LR-115 type II mean critical angle does not depend on the initial alpha particle energy except for 232Th, 238U, 230Th and 234Ra when the removed thickness ranged from 6 µm to 8 µm. Obtained data by using the current method and those obtained in the literature [18] are in good agreement with each other.

Sign in / Sign up

Export Citation Format

Share Document