The Use of Critical Point Phenomena in Preparing Specimens for the Electron Microscope
1981 ◽
Vol 121
(3)
◽
pp. 329-336
◽
1982 ◽
Vol 53
(2)
◽
pp. 510-515
◽
1976 ◽
Vol 43
(1)
◽
pp. 113-115
◽
Keyword(s):
1974 ◽
Vol 4
(2)
◽
pp. 181-202
◽