scholarly journals Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis

2004 ◽  
Vol 95 (11) ◽  
pp. 6527-6529 ◽  
Author(s):  
Jian Li ◽  
Carl Rau
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Magnetic Domain ◽  
Polarization Analysis ◽  
Domain Structures ◽  
Cobalt Films ◽  
Ion Microscopy

scholarly journals Scanning-Ion Microscopy with Polarization Analysis (Simpa)

1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau
Keyword(s):  
High Resolution ◽  
Spin Polarization ◽  
Imaging Technique ◽  
Ion Beam ◽  
Polarization Analysis ◽  
Polarized Electrons ◽  
Magnetic Structures ◽  
Magnetic Imaging ◽  
Spin Polarized ◽  
Ion Microscopy

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.

Atom Probe Field Ion Microscopy Of Multilayer Thin Films

1999 ◽  
Vol 5 (S2) ◽  
pp. 150-151
Author(s):  
D. J. Larson ◽  
A. K. Petford-Long ◽  
A. Cerezo ◽  
T. C. Anthony ◽  
M. K. Miller
Keyword(s):  
Giant Magnetoresistance ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Atom Probe ◽  
Operating Conditions ◽  
Specimen Preparation ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Compositional Variations

Multilayer film (MLF) structures which exhibit giant-magnetoresistance (GMR) properties have applications in the areas of magnetic recording and computer memory. The magnetic properties of MLF structures are dependent upon structural and compositional variations at the atomic level. Thus, structural characterization with high spatial resolution, especially at layer interfaces, is important in order to optimize device performance with respect to processing and operating conditions. Atom probe field ion microscopy (APFIM) is one technique that has the capability to characterize the local structure and composition of MLF devices with sufficiently high resolution. However, a major difficulty has been successful specimen preparation from MLF materials, which requires fabrication of a sharply pointed needle (radius <50 nm) containing the layers of interest in the apex region. Research on specialized field ion specimen preparation techniques which use focused ion beam milling has recently enabled nanoscale MLF structures to be investigated. In the present paper, the application of atom probe microanalysis to two different MLF structures is presented.

Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

2013 ◽  
Vol 58 (2) ◽  
pp. 413-417
Author(s):  
A. Czerwiński ◽  
A. Skwarek ◽  
M. Płuska ◽  
J. Ratajczak ◽  
K. Witek
Keyword(s):  
Printed Circuit Boards ◽  
Focused Ion Beam ◽  
Whisker Growth ◽  
Ion Beam ◽  
Energy Dispersive ◽  
The European Union ◽  
Tin Whisker ◽  
Tin Alloys ◽  
X Ray ◽  
Ion Microscopy

Tin-rich solders are widely applied in the electronic industry in the majority of modern printed circuit boards (PCBs). Because the use of lead-tin solders has been banned in the European Union since 2006, the problem of the bridging of adjacent conductors due to tin whisker growth (limited before by the addition of Pb) has been reborn. In this study tin alloys soldered on glass-epoxy laminate (typically used for PCBs) are considered. Scanning ion microscopy with Focused Ion Beam (FIB) system and energy-dispersive X-ray spectroscopy (EDXS) were used to determine correlations between spatial non-uniformities of the glass-epoxy laminate, the distribution of intermetallic compounds and whisker growth.

Nanoscale magnetic domain structures in epitaxial cobalt films

1996 ◽  
Vol 54 (5) ◽  
pp. 3428-3433 ◽  
Author(s):  
M. Hehn ◽  
S. Padovani ◽  
K. Ounadjela ◽  
J. P. Bucher
Keyword(s):  
Magnetic Domain ◽  
Domain Structures ◽  
Cobalt Films

Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices

1998 ◽  
Vol 4 (3) ◽  
pp. 308-316 ◽  
Author(s):  
R. Hull ◽  
J. Demarest ◽  
D. Dunn ◽  
E.A. Stach ◽  
Q. Yuan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Electronic Materials ◽  
Ion Beam ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Ion Microscopy

We discuss the application of ion microscopy and in situ electron microscopy to the study of electronic and optical materials and devices. We demonstrate how the combination of in situ transmission electron microscopy and focused ion beam microscopy provides new avenues for the study for such structures, enabling extension of these techniques to the study of dopant distributions, nanoscale stresses, three-dimensional structural and chemical reconstruction, and real-time evolution of defect microstructure. We also discuss in situ applications of thermal, mechanical, electrical, and optical stresses during transmission electron microscopy imaging.

Magnetic Domain Structure of NiFe and MnIr/NiFe Elements Patterned by Focused Ion Beam

2002 ◽  
Vol 41 (Part 2, No. 10A) ◽  
pp. L1078-L1080 ◽  
Author(s):  
Takeshi Kato ◽  
Keigo Suzuki ◽  
Shigeru Tsunashima ◽  
Satoshi Iwata
Keyword(s):  
Domain Structure ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Magnetic Domain ◽  
Magnetic Domain Structure
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