Influence of magnetic field on the tunneling current in magnetic 10-nm-scale point contact junctions using tunneling atomic force microscopy

2004 ◽  
Vol 95 (11) ◽  
pp. 7246-7248 ◽  
Author(s):  
Yasuyoshi Miyamoto ◽  
Kiyoshi Kuga ◽  
Naoto Hayashi ◽  
Kenji Machida ◽  
Ken-ichi Aoshima
Keyword(s):  
Magnetic Field ◽  
Atomic Force Microscopy ◽  
Point Contact ◽  
Tunneling Current ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Point

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB05 ◽  
Author(s):  
Tomoharu Kimura ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Point Contact ◽  
Electrical Characteristics ◽  
Force Microscopy ◽  
Atomic Force

Microstructure of magnetic field on permanent magnet surface

2016 ◽  
Author(s):  
Поляков ◽  
Petr Polyakov ◽  
Гинзбург ◽  
B. Ginzburg ◽  
Каминская ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Atomic Force Microscopy ◽  
Permanent Magnet ◽  
Phase Diagrams ◽  
Magnetic Structure ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ndfeb Permanent Magnet ◽  
Magnet Surface

In this case we investigate the NdFeB permanent magnet by the atomic force microscopy. Obtained phase diagrams in the center and on the edge of the sample. We investigate the uniformity of the magnetic structure.

Polarization-switching pathway determined electrical transport behaviors in rhombohedral BiFeO3 thin films

Nanoscale ◽  
2021 ◽  
Author(s):  
Jing Wang ◽  
Huayu Yang ◽  
Yue Wang ◽  
Yuanyuan Fan ◽  
Di Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Point Contact ◽  
Rhombohedral Phase ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bifeo3 Thin Films ◽  
Piezoelectric Force Microscopy

We investigate the polarization-switching pathway dependent electrical transport behaviors in rhombohedral-phase BiFeO3 thin films with a point contact geometry. By combining conducting-atomic force microscopy and piezoelectric force microscopy, we simultaneously...

scholarly journals Refinement of conditions of point-contact current imaging atomic force microscopy for molecular-scale conduction measurements

2007 ◽  
Vol 18 (9) ◽  
pp. 095501 ◽  
Author(s):  
Takashi Yajima ◽  
Hirofumi Tanaka ◽  
Takuya Matsumoto ◽  
Yoichi Otsuka ◽  
Yoshitaka Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Point Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Scale

ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

1997 ◽  
Vol 04 (05) ◽  
pp. 1025-1029 ◽  
Author(s):  
R. LÜTHI ◽  
E. MEYER ◽  
M. BAMMERLIN ◽  
A. BARATOFF ◽  
L. HOWALD ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrahigh Vacuum ◽  
Tunneling Current ◽  
Atomic Resolution ◽  
Restricted Range ◽  
Dissipation Energy ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Reconstructed Surface

In this note we report the first observation of salient features of the Si(111)(7×7) reconstructed surface across monatomic steps by dynamic atomic force microscopy (AFM) in ultrahigh vacuum (UHV). Simultaneous measurements of the resonance frequency shift Δf of the Si cantilever and of the mean tunneling current [Formula: see text] from the cleaned Si tip indicate a restricted range for stable imaging with true atomic resolution. The corresponding characteristics vs. distance reveal why feedback control via Δf is problematic, whereas it is as successful as in conventional STM via [Formula: see text]. Furthermore, local dissipation (energy loss of 10-14 W) through individual atoms is observed and explained by the coupling of the surface atoms to phonons.

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