Measurement of totally depleted silicon solid state detector thickness by x‐ray attenuation

1974 ◽  
Vol 45 (2) ◽  
pp. 226-231 ◽  
Author(s):  
Frederick A. Hanser ◽  
Bach Sellers
Keyword(s):  
Solid State ◽  
Solid State Detector ◽  
X Ray ◽  
State Detector ◽  
Detector Thickness

A solid state detector for soft energy extended x‐ray absorption fine structure measurements

1995 ◽  
Vol 66 (2) ◽  
pp. 2333-2335 ◽  
Author(s):  
A. D. Smith ◽  
G. E. Derbyshire ◽  
R. C. Farrow ◽  
A. Sery ◽  
T. W. Raudorf ◽  
...  
Keyword(s):  
Fine Structure ◽  
Solid State ◽  
Solid State Detector ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
State Detector

scholarly journals The Use of Silicium Solid-State Detector in Solar X-Ray Measurements

1971 ◽  
Vol 41 ◽  
pp. 214-214
Author(s):  
B. Valniček
Keyword(s):  
Solid State ◽  
Control Unit ◽  
Active Regions ◽  
High Energy ◽  
Radiation Belts ◽  
Solid State Detector ◽  
X Ray ◽  
Solar Active Regions ◽  
State Detector ◽  
Independent Indicator

The silicium solid-state detector has been used as control-detector in the X-ray photometer system on board of the satellite Interkosmos 1.The effectiveness of the use of such detector as control-unit for radiation-belts has been confirmed also as independent indicator of high energy X-ray quants during high levels emission of solar active regions.

Structure Of Ceria Overlayer On Zirconia Crystal Studied by Surface Diffraction

1995 ◽  
Vol 401 ◽  
Author(s):  
W. Dmowski ◽  
S. Fu ◽  
T. Egami ◽  
R. Gorte ◽  
J. Vhos
Keyword(s):  
Solid State ◽  
Incident Beam ◽  
Energy Dispersive ◽  
Surface Layers ◽  
Solid State Detector ◽  
Zirconia Crystal ◽  
X Ray ◽  
Cubic Zirconia ◽  
Surface Diffraction ◽  
State Detector

AbstractWe have utilized white x-ray beam and a Ge solid state detector, in energy dispersive mode, to study the diffraction from the surface layers of ceria deposited on (001) surface of Y stabilized cubic zirconia with grazing incident beam. We found that ceria forms islands, oriented epitaxially with respect to the zirconia substrate, with a lateral coherence of the order of 60 Å.

scholarly journals Quality control measurements for mobile X-ray unit through a solid state detector

2021 ◽  
Vol 1826 (1) ◽  
pp. 012053
Author(s):  
Gustavo Bernardes da Silva ◽  
Vinicius Mariotti ◽  
Matheus Silveira de Almeida Peixoto ◽  
Thatiane Pianoschi ◽  
Mirko S. Alva-S´anchez
Keyword(s):  
Quality Control ◽  
Solid State ◽  
Solid State Detector ◽  
X Ray ◽  
State Detector
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