A Mechanical Device for Controlling the Radial Intensity Distribution of a Light Beam

1972 ◽  
Vol 43 (1) ◽  
pp. 137-139
Author(s):  
R. Turner ◽  
C. J. van der Hoeven
2004 ◽  
Vol 69 (2) ◽  
Author(s):  
A. V. Taĭchenachev ◽  
A. M. Tumaikin ◽  
V. I. Yudin ◽  
M. Stähler ◽  
R. Wynands ◽  
...  

2005 ◽  
Vol 71 (2) ◽  
Author(s):  
A. V. Taĭchenachev ◽  
A. M. Tumaikin ◽  
V. I. Yudin ◽  
M. Stähler ◽  
R. Wynands ◽  
...  

2011 ◽  
Vol 133 (2) ◽  
Author(s):  
Shih-Chuan Yeh ◽  
Allen Jong-Woei Whang ◽  
Horng-Ching Hsiao ◽  
Xi-Duo Hu ◽  
Yi-Yung Chen

Prismatic elements are typical devices of natural light illumination system for redirecting and collecting daylight. Based on the principles of optics, this paper presents a simple mathematical matrix ray-tracing methodology through which a detailed intensity distribution of parallel light beam incident onto a right angled prism from different incident angles can be calculated precisely. We also present the distribution of the secondary emerged intensity from a prism illuminated by the emerged light of an adjacent prism. The direction, concentration, and distribution of intensity of the emerged light from the parallel light incident onto a surface of the right-angle prism, as well as daylight illuminate on a prismatic collector, are precisely calculated. The detailed calculation of the emerged light re-incident onto the adjacent prism or emerged out of the prismatic element presented that most of daylight are directly emerged out and are confined in some directions at earlier morning and afternoon, and the emerged light re-incident into the adjacent prism at noon around. This detailed calculation model of parallel light beam incident to a prismatic element can be applied to the hybrid natural light illumination system, as well as to the prism-relative solar illumination system for the improvement of efficiency.


Author(s):  
K. Izui ◽  
T. Nishida ◽  
S. Furuno ◽  
H. Otsu ◽  
S. Kuwabara

Recently we have observed the structure images of silicon in the (110), (111) and (100) projection respectively, and then examined the optimum defocus and thickness ranges for the formation of such images on the basis of calculations of image contrasts using the n-slice theory. The present paper reports the effects of a chromatic aberration and a slight misorientation on the images, and also presents some applications of structure images of Si, Ge and MoS2 to the radiation damage studies.(1) Effect of a chromatic aberration and slight misorientation: There is an inevitable fluctuation in the amount of defocus due to a chromatic aberration originating from the fluctuations both in the energies of electrons and in the magnetic lens current. The actual image is a results of superposition of those fluctuated images during the exposure time. Assuming the Gaussian distribution for defocus, Δf around the optimum defocus value Δf0, the intensity distribution, I(x,y) in the image formed by this fluctuation is given by


1981 ◽  
Vol 42 (C4) ◽  
pp. C4-597-C4-600 ◽  
Author(s):  
P. D. Persans ◽  
H. Fritzsche
Keyword(s):  

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