Electron Attachment and Compound Formation in Flames. III. Negative Ion and Compound Formation in Flames Containing Tungsten and Potassium

1970 ◽  
Vol 53 (8) ◽  
pp. 3287-3292 ◽  
Author(s):  
D. E. Jensen ◽  
W. J. Miller
Keyword(s):  
Electron Attachment ◽  
Negative Ion ◽  
Compound Formation

Dissociative Electron Attachment Processes in SO2 and NO2

1971 ◽  
Vol 49 (9) ◽  
pp. 1571-1574 ◽  
Author(s):  
D. A. Rallis ◽  
J. M. Goodings
Keyword(s):  
Kinetic Energy ◽  
Ground State ◽  
Electronic Excitation ◽  
Electron Attachment ◽  
Negative Ion ◽  
Dissociation Limit ◽  
Dissociative Electron Attachment ◽  
Zero Kinetic Energy ◽  
Trapped Electron ◽  
Second Peak

A trapped electron apparatus has been used to identify the processes involved in negative ion formation for the triatomic oxides SO2 and NO2. Two O− peaks are observed in SO2 with onset values at 4.2 ± 0.15 and 6.3 ± 0.2 eV, and peak values at 5.0 ± 0.15 and 7.4 ± 0.15 eV, respectively. From kinetic energy analysis of the O− ions, both peaks are found to have the same dissociation limit involving SO in its ground state. For NO2, two dissociative electron attachment peaks are observed with onset values at 1.6 ± 0.2 and 7.3 ± 0.3 eV, and peak values at 3.0 ± 0.2 and 8.1 ± 0.2 eV, respectively. The first broad peak is explained by overlapping contributions from two processes having the same dissociation limit involving ground state NO; they differ only in the amount of kinetic energy possessed by the fragments. The second peak appears to involve electronic excitation of the neutral fragment NO* with zero kinetic energy at onset.

scholarly journals Distinguishing between halogenated alkanes containing the same halogen based on the reaction kinetic parameter using negative ion mobility spectrometry at atmospheric pressure

RSC Advances ◽  
2020 ◽  
Vol 10 (49) ◽  
pp. 29441-29449
Author(s):  
Haiyan Han ◽  
Shihu Du ◽  
Yongliang Yan ◽  
Xiuhong Liu ◽  
Qiaofen Zhu ◽  
...  
Keyword(s):  
Kinetic Parameter ◽  
Ion Mobility Spectrometry ◽  
Ion Mobility ◽  
Atmospheric Pressure ◽  
Reaction Kinetic ◽  
Electron Attachment ◽  
High Sensitivity ◽  
Negative Ion ◽  
Volatile Organic ◽  
Halogenated Alkanes

Electron attachment ionization ion mobility spectrometry can be used to detect halogen-containing volatile organic compounds with high sensitivity.

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