Emission of Radiation in the Vacuum Ultraviolet by Impact of Electrons on Carbon Monoxide

1970 ◽  
Vol 52 (10) ◽  
pp. 5354-5360 ◽  
Author(s):  
J. F. M. Aarts ◽  
F. J. de Heer
1970 ◽  
Vol 52 (5) ◽  
pp. 2205-2221 ◽  
Author(s):  
John P. Appleton ◽  
Martin Steinberg ◽  
David J. Liquornik

1982 ◽  
Vol 43 (4) ◽  
pp. 287-291 ◽  
Author(s):  
Fabrice Vallée ◽  
Jacques Lukasik

1982 ◽  
Vol 42 (2) ◽  
pp. 148-150 ◽  
Author(s):  
Fabrice Vallée ◽  
Stephen C. Wallace ◽  
Jacques Lukasik

2012 ◽  
Vol 65 (2) ◽  
pp. 129 ◽  
Author(s):  
Jean-Baptiste Bossa ◽  
Fabien Borget ◽  
Fabrice Duvernay ◽  
Grégoire Danger ◽  
Patrice Theulé ◽  
...  

Solid-phase methylamine (CH3NH2) was vacuum ultraviolet (VUV) photoprocessed at low temperature (20 K) using a hydrogen flow discharge lamp, which allows irradiation down to 120 nm. Methanimine (CH2=NH), the methylammonium cation (CH3NH3+) and the counterion CN–, as well as the amino radical (NH2), methane (CH4) and ammonia (NH3), were identified as the photoproducts by using FTIR spectroscopy. So far, the branching ratios of the photodissociation pathways of methylamine in the solid phase remain unknown. The methylamine molecule holds two non-equivalent hydrogen atoms on the methyl and the amino group, so we can expect the formation of two distinct radicals via a carbon–hydrogen or a nitrogen–hydrogen bond cleavage, namely CH2NH2 and CH3NH. These radicals are highly reactive and may reform methylamine with hydrogen atom recombination. Their direct infrared spectroscopic detection is therefore tricky. To solve that problem, we use carbon monoxide (CO) as an H radical scavenger, forming the intermediate species HCO. After the irradiation of a CH3NH2 : CO binary ice mixture, formamide (NH2CHO) and N-methylformamide (CH3NHCHO) were identified as the main photoproducts using both infrared and mass spectrometry. We give a rough approximation of the branching ratios, which are in agreement with previous studies in the gas phase.


2000 ◽  
Vol 105 (D19) ◽  
pp. 24251-24261 ◽  
Author(s):  
John S. Holloway ◽  
Roger O. Jakoubek ◽  
David D. Parrish ◽  
Christoph Gerbig ◽  
Andreas Volz-Thomas ◽  
...  

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