Spatial distribution of backscattered electrons in the scanning electron microscope and electron microprobe

1974 ◽  
Vol 45 (9) ◽  
pp. 4110-4117 ◽  
Author(s):  
Kenji Murata
Keyword(s):  
Spatial Distribution ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microprobe ◽  
Backscattered Electrons ◽  
Scanning Electron

scholarly journals Coloring Pictures for Electron Microscopists or Elements of Digital Image Manipulation for Students

2008 ◽  
Vol 16 (4) ◽  
pp. 62-63
Author(s):  
V.M. Dusevich ◽  
J.H. Purk ◽  
J.D. Eick
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Digital Image ◽  
Secondary Electron ◽  
Image Manipulation ◽  
Sem Micrographs ◽  
Backscattered Electrons ◽  
Digital Picture ◽  
Scanning Electron

Coloring pictures is an educational exercise, which is fun, and helps develop important skills. Coloring SEM micrographs is especially suitable for electron microscopists. Color micrographs are not just great looking on a lab wall; they inspire both microscopists and students to exercise digital picture manipulation. Many microscopists enjoyed looking at the beautiful color micrographs by D. Scharf, but were frustrated to learn they needed a very particular scanning electron microscope equipped with multiple secondary electron detectors in order to color their own pictures. Fortunately, there are other ways to color SEM micrographs. Most SEMs are equipped with at least two detectors, for secondary and backscattered electrons.

Réactivités aux alcalis du grès de Potsdam dans les bétons

1977 ◽  
Vol 4 (3) ◽  
pp. 332-344 ◽  
Author(s):  
J. Berard ◽  
N. Lapierre
Keyword(s):  
New York ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Silica Gel ◽  
Electron Microprobe ◽  
Rock Type ◽  
Secondary Minerals ◽  
Alkali Silica Reactivity ◽  
External Sources ◽  
Scanning Electron

Numerous old concrete structures showing signs of disintegration are found in the Beauharnois–Valleyfield area located to the southwest of Montreal.After a short examination of some of the structures, evidences of alkali–silica reactivity appear to be related to sandstone aggregates belonging to the Potsdam group. This rock type, although common in the state of New York and in the provinces of Quebec and Ontario, is only very rarely used as an aggregate owing to its hardness and abrasion. Nevertheless, when available from important excavation sites it has sometimes been used as an aggregate with ordinary alkali-rich cements.The products of the chemical reactions between the siliceous aggregates and the cement were studied with a polarizing microscope, a scanning electron microscope, an electron microprobe, and a thermobalance and differential thermoanalyser.During these studies superposed layers of silica gel of variable composition were found and secondary minerals were also identified. The Na/K ratio was found to increase in the more recent layers of silica gel suggesting that sodium could have been added within the structures as winter de-icing salts.The hypothesis is put forward that even if a low alkali cement is used with this Potsdam sandstone, alkali–silica reactivity could still occur in the presence of alkalies from external sources.

The Determination and Application of the Point Spread Function in the Scanning Electron Microscope

2018 ◽  
Vol 24 (4) ◽  
pp. 396-405 ◽  
Author(s):  
Matthew D. Zotta ◽  
Mandy C. Nevins ◽  
Richard K. Hailstone ◽  
Eric Lifshin
Keyword(s):  
Spatial Distribution ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Current ◽  
Beam Shape ◽  
Practical Applications ◽  
Energy Beam ◽  
Working Distance ◽  
Scanning Electron

AbstractA method is presented to determine the spatial distribution of electrons in the focused beam of a scanning electron microscope (SEM). Knowledge of the electron distribution is valuable for characterizing and monitoring SEM performance, as well as for modeling and simulation in computational scanning electron microscopy. Specifically, it can be used to characterize astigmatism as well as study the relationship between beam energy, beam current, working distance, and beam shape and size. In addition, knowledge of the distribution of electrons in the beam can be utilized with deconvolution methods to improve the resolution and quality of backscattered, secondary, and transmitted electron images obtained with thermionic, FEG, or Schottky source instruments. The proposed method represents an improvement over previous methods for determining the spatial distribution of electrons in an SEM beam. Several practical applications are presented.

New Instrumental Techniques and Their Application to Electron Microprobe Analysis and Scanning Electron Microscopy

1970 ◽  
Vol 24 (4) ◽  
pp. 420-426 ◽  
Author(s):  
James P. Smith ◽  
Lee R. Reid
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microprobe ◽  
Secondary Electron Emission ◽  
Rate Analysis ◽  
Quantitative Measurements ◽  
Modulation Techniques ◽  
New Instrumentation ◽  
Phase Sensitive ◽  
Scanning Electron

This paper reviews several applications of new instrumentation which have been developed for the electron microprobe analyzer and the scanning electron microscope. By using signal modulation techniques and phase sensitive detection, the information from the scanning electron microscope is made more quantitative. Digital techniques applied to photomultiplier outputs allow more sensitive and quantitative measurements of cathodoluminescence intensities and secondary electron emission. The technique of pulse rate analysis is used to enhance the information contained in x-ray scanning micrographs from an electron microprobe analyzer. Several examples of these techniques are discussed.

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