Conducting-tip atomic force microscopy for injection and probing of localized charges in silicon nanocrystals

2003 ◽  
Vol 83 (18) ◽  
pp. 3788-3790 ◽  
Author(s):  
Souri Banerjee ◽  
Mohamed Ali Salem ◽  
Shunri Oda
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Nanocrystals ◽  
Force Microscopy ◽  
Atomic Force

Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy

2005 ◽  
Vol 86 (3) ◽  
pp. 033109 ◽  
Author(s):  
S. Decossas ◽  
J. Vitiello ◽  
T. Baron ◽  
F. Mazen ◽  
S. Gidon
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Nanocrystals ◽  
Ultrahigh Vacuum ◽  
Force Microscopy ◽  
Atomic Force

Free-Standing 2D Silicon Nanocrystals Stabilized with Perfluorophenyl Ligands: Experiment and Ab Initio Research

2015 ◽  
Vol 233-234 ◽  
pp. 575-578 ◽  
Author(s):  
Leonid Aslanov ◽  
Igor Kudryavtsev ◽  
Valery Zakharov ◽  
Erkin Kulatov ◽  
Yurii Uspenskii
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Ab Initio ◽  
Electronic Structures ◽  
Silicon Nanocrystals ◽  
Silicon Nanoparticles ◽  
Free Standing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Easy Integration

Silicon (Si) is currently the basis of most of nanodevice technology, therefore ultrathin materials based on Si have the great advantage of easy integration into existing circuitry. First flat silicon nanoparticles have been obtained with perfluorophenyl (PFPh) ligand coating. The size of these particles varied from 15 to 50 nm. Their thickness evaluated with the atomic force microscopy was about 3.3 nm. Based on ab initio DFT calculations we investigate the geometries and electronic structures of free-standing PFPh-stabilized 2D silicon in order to see if such systems have promising electronic and optical properties. We also examined the effect of doping PFPh-stabilized 2D silicon by the Mn atoms.

Atomic force microscopy nanomanipulation of silicon nanocrystals for nanodevice fabrication

2003 ◽  
Vol 14 (12) ◽  
pp. 1272-1278 ◽  
Author(s):  
Sébastien Decossas ◽  
Frédéric Mazen ◽  
Thierry Baron ◽  
Georges Brémond ◽  
Abdelkader Souifi
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Nanocrystals ◽  
Force Microscopy ◽  
Atomic Force
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