Transmission electron microscopy study of damaged layer on GaAs surface induced by low-energy ion irradiation

J. Kato; T. Nagatomi; Y. Takai

doi:10.1063/1.1619191

Transmission electron microscopy study of damaged layer on GaAs surface induced by low-energy ion irradiation

Journal of Applied Physics ◽

10.1063/1.1619191 ◽

2003 ◽

Vol 94 (10) ◽

pp. 6372-6375 ◽

Cited By ~ 5

Author(s):

J. Kato ◽

T. Nagatomi ◽

Y. Takai

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Irradiation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Low Energy ◽

Gaas Surface ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of low-energy ion-induced damaged layer

Surface and Interface Analysis ◽

10.1002/sia.1977 ◽

2005 ◽

Vol 37 (2) ◽

pp. 256-260 ◽

Cited By ~ 2

Author(s):

J. Kato ◽

T. Nagatomi ◽

Y. Takai

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Low Energy ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In situ transmission electron microscopy study of growth of dislocation loops in Fe-Ni alloy under ion irradiation

Scripta Materialia ◽

10.1016/j.scriptamat.2020.06.071 ◽

2020 ◽

Vol 187 ◽

pp. 453-457

Author(s):

Liang Chen ◽

Kenta Murakami ◽

Dongyue Chen ◽

Hiroaki Abe ◽

Zhengcao Li ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Irradiation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Dislocation Loops ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Ni Alloy

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Transmission electron microscopy study of extended defect evolution and amorphization in SiC under Si ion irradiation

Journal of the American Ceramic Society ◽

10.1111/jace.17595 ◽

2020 ◽

Author(s):

Jean‐Marc Costantini ◽

Joël Ribis

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Irradiation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Extended Defect ◽

Transmission Electron ◽

Defect Evolution

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An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe

Scripta Materialia ◽

10.1016/j.scriptamat.2015.11.010 ◽

2016 ◽

Vol 113 ◽

pp. 190-193 ◽

Cited By ~ 5

Author(s):

P.D. Edmondson ◽

K.J. Abrams ◽

J.A. Hinks ◽

G. Greaves ◽

C.J. Pawley ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Irradiation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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