Spatially resolved electron energy-loss spectroscopy of an interfacial structure at a Ti thin film Cu interconnect
1995 ◽
Vol 13
(6)
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pp. 2689-2697
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2002 ◽
Vol 51
(5)
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pp. 291-296
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2015 ◽
Vol 56
(5)
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pp. 617-624
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1994 ◽
Vol 297
(1-2)
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pp. 97-108
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