Transmission electron microscopy investigation of the high temperature BiScO3−PbTiO3 piezoelectric ceramic system

C. A. Randall; R. E. Eitel; T. R. Shrout; D. I. Woodward; I. M. Reaney

doi:10.1063/1.1573340

Transmission electron microscopy investigation of the high temperature BiScO3−PbTiO3 piezoelectric ceramic system

Journal of Applied Physics ◽

10.1063/1.1573340 ◽

2003 ◽

Vol 93 (11) ◽

pp. 9271-9274 ◽

Cited By ~ 61

Author(s):

C. A. Randall ◽

R. E. Eitel ◽

T. R. Shrout ◽

D. I. Woodward ◽

I. M. Reaney

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Piezoelectric Ceramic ◽

Transmission Electron Microscopy Investigation ◽

Ceramic System ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperature

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_236 ◽

2008 ◽

pp. 471-472

Author(s):

P. J. Bellina ◽

F. Phillipp ◽

P. A. van Aken

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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High temperature deformation of diopside single crystal. 2. Transmission electron microscopy investigation of the defect microstructures

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(92)93774-e ◽

1992 ◽

Vol 29 (3) ◽

pp. A153

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

High Temperature Deformation ◽

Temperature Deformation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Defect Microstructures

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Scanning Transmission Electron Microscopy Investigation of Differences in the High Temperature Redox Deactivation Behavior of CePrOxParticles Supported on Modified Alumina

Chemistry of Materials ◽

10.1021/cm8029054 ◽

2009 ◽

Vol 21 (6) ◽

pp. 1035-1045 ◽

Cited By ~ 15

Author(s):

Miguel López-Haro ◽

Karima Aboussaïd ◽

Juan C. Gonzalez ◽

Juan C. Hernández ◽

José M. Pintado ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Modified Alumina ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Scanning Transmission

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High-temperature deformation of diopside single crystal: 2. Transmission electron microscopy investigation of the defect microstructures

Journal of Geophysical Research Atmospheres ◽

10.1029/91jb01233 ◽

1991 ◽

Vol 96 (B9) ◽

pp. 14287-14297 ◽

Cited By ~ 51

Author(s):

J. Ingrin ◽

N. Doukhan ◽

J. C. Doukhan

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

High Temperature Deformation ◽

Temperature Deformation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Defect Microstructures

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Transmission electron microscopy investigation of borondoped polycrystalline chemically vapour-deposited diamond

Philosophical Magazine A ◽

10.1080/01418610210131029 ◽

2002 ◽

Vol 82 (9) ◽

pp. 1741-1768 ◽

Cited By ~ 4

Author(s):

J. W. Steeds ◽

A. E. Mora ◽

J. E. Butler ◽

K. M. Bussmann

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation of texture development in magnesium oxide buffer layers

IEEE Transactions on Applied Superconductivity ◽

10.1109/77.919811 ◽

2001 ◽

Vol 11 (1) ◽

pp. 3473-3476 ◽

Cited By ~ 18

Author(s):

R.E. Koritala ◽

M.P. Chudzik ◽

Zhiping Luo ◽

D.J. Miller ◽

C.R. Kannewurf ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Magnesium Oxide ◽

Buffer Layers ◽

Texture Development ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In situ scanning and transmission electron microscopy investigation on plastic deformation in a metastable β titanium alloy

Acta Materialia ◽

10.1016/j.actamat.2017.05.018 ◽

2017 ◽

Vol 133 ◽

pp. 21-29 ◽

Cited By ~ 36

Author(s):

Tingting Yao ◽

Kui Du ◽

Haoliang Wang ◽

Zhiye Huang ◽

Cuihong Li ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Plastic Deformation ◽

Titanium Alloy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In Situ Liquid Cell Transmission Electron Microscopy Investigation on the Dissolution-Regrowth Mechanism Dominating the Shape Evolution of Silver Nanoplates

Crystal Growth & Design ◽

10.1021/acs.cgd.0c01573 ◽

2021 ◽

Author(s):

Meng Dong ◽

Ruining Fu ◽

Huihua Min ◽

Qiubo Zhang ◽

Hui Dong ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Shape Evolution ◽

Transmission Electron Microscopy Investigation ◽

Silver Nanoplates ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Liquid Cell

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High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems

Ultramicroscopy ◽

10.1016/0304-3991(94)90114-7 ◽

1994 ◽

Vol 54 (2-4) ◽

pp. 156-165 ◽

Cited By ~ 7

Author(s):

L.J. Chen ◽

J.M. Liang ◽

C.S. Liu ◽

W.Y. Hsieh ◽

J.H. Lin ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation and first-principles calculation of the phase stability in epitaxial CuInS2 and CuGaSe2 films

Applied Physics Letters ◽

10.1063/1.123014 ◽

1999 ◽

Vol 74 (17) ◽

pp. 2483-2485 ◽

Cited By ~ 40

Author(s):

D. S. Su ◽

Su-Huai Wei

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Stability ◽

First Principles ◽

First Principles Calculation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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