Determination of nanostructures and mechanical properties on the surface of molybdenum dithiocarbamate and zinc dialkyl-dithiophosphate tribochemical reacted films using atomic force microscope phase imaging technique

2003 ◽  
Vol 93 (9) ◽  
pp. 5113-5117 ◽  
Author(s):  
Jiping Ye ◽  
Makoto Kano ◽  
Yoshiteru Yasuda
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Imaging Technique ◽  
Phase Imaging ◽  
Zinc Dialkyl Dithiophosphate ◽  
Atomic Force ◽  
Dialkyl Dithiophosphate

Investigating hollow corundum microspheres exfoliation of the elastomeric matrix

2019 ◽  
pp. 135-142
Author(s):  
N. V. Shadrinov ◽  
U. V. Evseeva
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Butadiene Rubber ◽  
Nitrile Butadiene Rubber ◽  
Elastomeric Matrix ◽  
Atomic Force

The results of study of the influence of hollow corundum microspheres HCM-S (5–100 µm) and HCM-L (70–180 µm) on the properties of nitrile butadiene rubber BNKS-18 are presented. The dependence of elastomer resistance to abrasion impact and physic and mechanical properties on the dispersion and concentration of hollow corundum microspheres is shown. The process of hollow corundum microspheres exfoliation of the elastomeric matrix, which largely determines the change of physic and mechanical properties, has been studied by specially developed stretching device compatible with an atomic force microscope. The paper describes microspheres exfoliation which is conventionally divided into 3 stages.

Determination of performance on tunnel conduction through molecular wire using a conductive atomic force microscope

2001 ◽  
Vol 79 (22) ◽  
pp. 3708-3710 ◽  
Author(s):  
Hiroshi Sakaguchi ◽  
Atsushi Hirai ◽  
Futoshi Iwata ◽  
Akira Sasaki ◽  
Toshihiko Nagamura ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Molecular Wire ◽  
Atomic Force

Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

1999 ◽  
Vol 5 (S2) ◽  
pp. 962-963
Author(s):  
M. VanLandingham ◽  
X. Gu ◽  
D. Raghavan ◽  
T. Nguyen
Keyword(s):  
Energy Dissipation ◽  
Atomic Force Microscope ◽  
Mechanical Response ◽  
Sample Surface ◽  
Phase Changes ◽  
Phase Imaging ◽  
Polymer Systems ◽  
Atomic Force ◽  
Phase Images ◽  
Multi Phase

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing heterogeneities in the polymer microstructure that are not apparent from the topographic image. The enhanced contrast provided by phase images often allows for identification of different material constituents. However, while the phase changes of the oscillating probe are associated with energy dissipation between the probe tip and the sample surface, the relationship between this energy dissipation and the sample properties is not well understood.As the popularity of phase imaging has grown, the capability of the AFM to measure nanoscale indentation response of polymers has also been explored. Both techniques are ideal for the evaluation of multi-phase and multi-component polymer systems.

scholarly journals Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

2019 ◽  
Vol 9 (13) ◽  
pp. 2604 ◽  
Author(s):  
Ashley D. Slattery ◽  
Adam J. Blanch ◽  
Cameron J. Shearer ◽  
Andrew J. Stapleton ◽  
Renee V. Goreham ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Correction Factor ◽  
Young's Modulus ◽  
Spring Constant ◽  
Beam Equation ◽  
Euler Beam ◽  
Plan View ◽  
Atomic Force

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial when quantifying adhesive forces, material properties of surfaces, and in determining deposited mass for sensing applications. A key component in the spring constant of a cantilever is the plan-view shape. In recent years, the trapezoidal plan-view shape has become available since it offers certain advantages to fast-scanning AFM and can improve sensor performance in fluid environments. Euler beam equations relating cantilever stiffness to the cantilever dimensions and Young’s modulus have been proven useful and are used extensively to model cantilever mechanical behaviour and calibrate the spring constant. In this work, we derive a simple correction factor to the Euler beam equation for a beam-shaped cantilever that is applicable to any cantilever with a trapezoidal plan-view shape. This correction factor is based upon previous analytical work and simplifies the application of the previous researchers formula. A correction factor to the spring constant of an AFM cantilever is also required to calculate the torque produced by the tip when it contacts the sample surface, which is also dependent on the plan-view shape. In this work, we also derive a simple expression for the torque for triangular plan-view shaped cantilevers and show that for the current generation of trapezoidal plan-view shaped AFM cantilevers, this will be a good approximation. We shall apply both these correction factors to determine Young’s modulus for a range of trapezoidal-shaped AFM cantilevers, which are specially designed for fast-scanning. These types of AFM probes are much smaller in size when compared to standard AFM probes. In the process of analysing the mechanical properties of these cantilevers, important insights are also gained into their spring constant calibration and dimensional factors that contribute to the variability in their spring constant.

Determination of the creep function using atomic force microscope

2020 ◽  
Vol 259 ◽  
pp. 126872
Author(s):  
Alexander P. Kren ◽  
Alexander S. Machikhin ◽  
Marat F. Bulatov
Keyword(s):  
Atomic Force Microscope ◽  
Creep Function ◽  
Atomic Force
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