Calorimetric and x-ray analysis of the intermediate phase formation in Cu/Mg multilayers

2003 ◽  
Vol 93 (8) ◽  
pp. 4447-4453 ◽  
Author(s):  
J. Rodrı́guez-Viejo ◽  
M. Gonzalez-Silveira ◽  
M. T. Clavaguera-Mora
Keyword(s):  
Phase Formation ◽  
Intermediate Phase ◽  
X Ray

Intermediate phase formation during Hg-2212 synthesis by in-situ X-ray synchrotron diffraction

2000 ◽  
Vol 341-348 ◽  
pp. 2457-2458 ◽  
Author(s):  
P. Toulemonde ◽  
S. Le Floch ◽  
P. Bordet ◽  
J.J. Capponi ◽  
M. Mezouar ◽  
...  
Keyword(s):  
Phase Formation ◽  
Intermediate Phase ◽  
Synchrotron Diffraction ◽  
X Ray

Phase Formation in FeOx-SiO2-Cu2O-ZnO-FeS System during Melts Crystallization

2010 ◽  
Vol 297-301 ◽  
pp. 602-607
Author(s):  
Evgeny N. Selivanov ◽  
R.I. Gulyaeva ◽  
N.I. Selmenskich
Keyword(s):  
Cooling Rate ◽  
Phase Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Two Samples ◽  
And Calorimetry

The phase formation in oxide-sulphidic systems was studied with the use of X-ray diffraction, mineralography, combined thermogravimetry and calorimetry, in addition to Х-ray spectral microanalysis. The purpose of this work was to estimate the effect of cooling rate of melts in FeOx-SiO2-Cu2O-ZnO-FeS systems on structure and content of the resulting phases. Test subjects were two samples having following compositions (wt. %): I - 40.5 Fe, 2.41 S, 0.87 Cu, 3.87 Zn, 32.1 SiO2 and II - 40.7 Fe, 3.05 S, 8.55 Cu, 4.1 Zn and 19.5 SiO2. Cooling rate of the melts was changed from 0.3 up to 900оС/s.

X-ray absorption studies of phase formation in a Ti/TiN coating on cubic boron nitride

2004 ◽  
Vol 362 (1-2) ◽  
pp. 171-177 ◽  
Author(s):  
E Piskorska ◽  
K Lawniczak-Jablonska ◽  
I.N Demchenko ◽  
E Benko ◽  
E Welter
Keyword(s):  
Boron Nitride ◽  
Phase Formation ◽  
Cubic Boron Nitride ◽  
Tin Coating ◽  
X Ray ◽  
Absorption Studies ◽  
X Ray Absorption

Effect of WC Addition on Phase Formation and Microstructure of TiC-Ni Composites

2008 ◽  
Vol 55-57 ◽  
pp. 353-356
Author(s):  
Nawarat Wora-uaychai ◽  
Nuchthana Poolthong ◽  
Ruangdaj Tongsri
Keyword(s):  
Liquid Phase ◽  
Tungsten Carbide ◽  
Phase Formation ◽  
Liquid Phase Sintering ◽  
Precipitation Process ◽  
Solid Solution Phase ◽  
Binder Phase ◽  
Sintering Process ◽  
X Ray Diffraction ◽  
X Ray

In this research, titanium carbide-nickel (TiC-Ni) composites, with tungsten carbide addition, were fabricated by using a powder metallurgy technique. The TiC-Ni mixtures containing between 0-15 wt. % tungsten carbide (WC), were compacted and then sintered at 1300°C and 1400°C, respectively. The phase formation and microstructure of the WC-added TiC-Ni composites have been investigated by X-ray diffraction and scanning electron microscopy techniques. Mechanical properties of these composites were assessed by an indentation technique. The X-ray diffraction patterns showed no evidence of tungsten rich phases in the sintered WC-added cermets. This indicates that during the sintering process, tungsten carbide particles were dissolved in metallic binder phase (Ni phase) via dissolution/re-precipitation process during liquid phase sintering. The liquid phase formed during sintering process could improve sinterability of TiC-based cermets i.e., it could lower sintering temperatures. The TiC-Ni composites typically exhibited a core-rim structure. The cores consisted of undissolved TiC particles enveloped by rims of (Ti, W)C solid solution phase. Hardness of TiC-Ni composites increased with WC content. Sintering temperature also had a slight effect on hardness values.

Crystallization of Amorphous Thin BST/MgO(001) Films Grown by R.F. Magnetron Sputtering

1997 ◽  
Vol 493 ◽  
Author(s):  
D. Y. Noh ◽  
H. H. Lee ◽  
J. H. Je ◽  
H. K. Kim
Keyword(s):  
Thick Film ◽  
Intermediate Phase ◽  
Perovskite Phase ◽  
Pyrochlore Phase ◽  
Interface Area ◽  
Crystalline Orientation ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Experiment ◽  
Film Substrate

ABSTRACTThe crystallization of amorphous BST thin films was studied in a synchrotron x-ray scattering experiment. At around 600°C, an intermediate phase, which was suspected to be a metastable pyrochlore phase, was formed. The x-ray reflectivity curves showed that the film-substrate interface became rough as the pyrochlore-like phase was formed. This suggests that the pyrochlore phase was nucleated near the interface area. Upon further annealing to higher temperatures, the film transformed to the crystalline perovskite phase. The crystallization was sensitive to the film thickness. In the thin 550Å thick film, the crystallization occurred at 750 °C with the <001> preferred orientation. On the other hand, the 5500Å thick film became crystalline even at 500°C with random crystalline orientation. The observed thickness dependence of the crystallization suggests that the crystalline perovskite phase was nucleated in the bulk of the film, rather than the near interface area.

Effect of a thin Ta layer on the C49-C54 transition.

2000 ◽  
Vol 611 ◽  
Author(s):  
F. La Via ◽  
F. Mammoliti ◽  
M.G. Grimaldi ◽  
S. Quilici ◽  
F. Meinardi
Keyword(s):  
Sheet Resistance ◽  
Phase Formation ◽  
Intermediate Phase ◽  
Transformation Kinetic ◽  
Structural Characterisation ◽  
Order Of Magnitude

ABSTRACTThe effect of a thin Ta layer at the Ti/Si interface on the kinetic of the C49-C54 transition will be shown in detail. The transformation kinetic has been monitored by in situ sheet resistance measurements that, coupled to structural characterisation, allowed to evidence the presence of an intermediate phase before the C54 formation. The temperature of the C54 phase formation decreases with a Ta concentration of 4.5·1015 cm−2 and μ-Raman images of partially transformed samples indicates that the density of C54 grains in presence of Ta is about one order of magnitude higher with respect to pure Ti/Si samples.

Model of Lateral Growth Stage during Reactive Phase Formation

2008 ◽  
Vol 277 ◽  
pp. 47-52 ◽  
Author(s):  
Mykola Pasichnyy ◽  
Andriy Gusak
Keyword(s):  
Phase Formation ◽  
Driving Force ◽  
Growth Process ◽  
Growth Stage ◽  
Intermediate Phase ◽  
Reactive Diffusion ◽  
Composition Gradient ◽  
Lateral Growth ◽  
Proposed Model ◽  
Asymmetric Case

Lateral growth of intermediate phase during reactive diffusion was analyzed. Proposed model is based on the assumption that the main driving force of the lateral growth process is the chemical one (proportional to composition gradient along the interface). Asymmetric case of phase formation taking into account the curvature of all three interfaces at the triple joint is considered.

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