Electronic sample-and-hold circuit to minimize artifacts during high-temperature Auger electron spectroscopy measurements
Keyword(s):
1990 ◽
Vol 6
(2)
◽
pp. 124-133
◽
1976 ◽
Vol 72
(0)
◽
pp. 1919
◽
Keyword(s):
1975 ◽
Vol 12
(1)
◽
pp. 338-340
◽
2005 ◽
Vol 252
(5)
◽
pp. 1806-1811
◽
Keyword(s):