A low-temperature ultrahigh vacuum atomic force microscope for biological applications

2003 ◽  
Vol 74 (2) ◽  
pp. 1022-1026 ◽  
Author(s):  
Alexandra Radenović ◽  
Eva Bystrenová ◽  
Laurent Libioulle ◽  
Mauro Taborelli ◽  
James A. DeRose ◽  
...  
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Biological Applications ◽  
Atomic Force

Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

2011 ◽  
Vol 82 (2) ◽  
pp. 023705 ◽  
Author(s):  
U. Gysin ◽  
S. Rast ◽  
M. Kisiel ◽  
C. Werle ◽  
E. Meyer
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever

2000 ◽  
Vol 157 (4) ◽  
pp. 343-348 ◽  
Author(s):  
N. Suehira ◽  
Y. Tomiyoshi ◽  
K. Sugiyama ◽  
S. Watanabe ◽  
T. Fujii ◽  
...  
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3750-3752 ◽  
Author(s):  
Katsuyuki Suzuki ◽  
Masashi Iwatsuki ◽  
Shin-ichi Kitamura ◽  
Charles B. Mooney
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Ultrahigh Vacuum ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Atomic Force

Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope

1995 ◽  
Vol 34 (Part 2, No. 8B) ◽  
pp. L1086-L1088 ◽  
Author(s):  
Hitoshi Ueyama ◽  
Masahiro Ohta ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

A new force controlled atomic force microscope for use in ultrahigh vacuum

1996 ◽  
Vol 67 (6) ◽  
pp. 2281-2285 ◽  
Author(s):  
S. P. Jarvis ◽  
H. Yamada ◽  
S.‐I. Yamamoto ◽  
H. Tokumoto
Keyword(s):  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum

1997 ◽  
Vol 70 (17) ◽  
pp. 2238-2240 ◽  
Author(s):  
S. P. Jarvis ◽  
S.-I. Yamamoto ◽  
H. Yamada ◽  
H. Tokumoto ◽  
J. B. Pethica
Keyword(s):  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Surface Interactions ◽  
Atomic Force
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