Adhesive forces investigation on a silicon tip by contact-mode atomic force microscope

2002 ◽  
Vol 81 (14) ◽  
pp. 2623-2625 ◽  
Author(s):  
Vincent Agache ◽  
Bernard Legrand ◽  
Dominique Collard ◽  
Lionel Buchaillot
Keyword(s):  
Atomic Force Microscope ◽  
Contact Mode ◽  
Atomic Force ◽  
Adhesive Forces

Study of adhesive forces on a silicon nanotip by atomic force microscope in contact mode

2002 ◽  
Author(s):  
Vincent Agache ◽  
Bernard Legrand ◽  
Dominique Collard ◽  
Lionel Buchaillot
Keyword(s):  
Atomic Force Microscope ◽  
Contact Mode ◽  
Atomic Force ◽  
Silicon Nanotip ◽  
Adhesive Forces

scholarly journals Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

2021 ◽  
Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Piezoelectric Actuator ◽  
High Speed ◽  
Closed Loop ◽  
Coefficient Of Thermal Expansion ◽  
Measuring System ◽  
Contact Mode ◽  
Loop Control ◽  
Atomic Force ◽  
Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

scholarly journals Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 362
Author(s):  
Luke Oduor Otieno ◽  
Bernard Ouma Alunda ◽  
Jaehyun Kim ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscope ◽  
Natural Frequency ◽  
High Speed ◽  
Contact Mode ◽  
Ongoing Process ◽  
Atomic Force ◽  
Constant Height ◽  
Mode Tracking

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.

Manipulation of Nickel Nanoparticles Deposited on HOPG

2004 ◽  
Vol 853 ◽  
Author(s):  
Massood Z. Atashbar ◽  
Valery N. Bliznyuk ◽  
Srikanth Singamaneni
Keyword(s):  
Atomic Force Microscope ◽  
Magnetic Force ◽  
Nickel Nanoparticles ◽  
Pyrolytic Graphite ◽  
Critical Force ◽  
Contact Mode ◽  
Cyclic Voltametry ◽  
Atomic Force ◽  
Nickel Nanowires ◽  
Plating Solution

ABSTRACTNickel nanowires were fabricated by electrodepositing Ni from an aqueous plating solution onto the step edges of Highly Oriented Pyrolytic Graphite (HOPG). Freshly cleaved HOPG was exposed to a plating solution of nickel and electro chemically deposited by cyclic voltametry. The morphology of the deposited nanoparticles was studied using an Atomic Force Microscope (AFM) in non-contact mode. The magnetic force of interaction between the nanoparticles was studied by magnetizing the particles. The critical force to displace the nanoparticles was estimated using contact mode of AFM.

Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

1998 ◽  
Vol 05 (05) ◽  
pp. 989-996
Author(s):  
E. V. Blagov ◽  
G. L. Klimchitskaya ◽  
V. M. Mostepanenko
Keyword(s):  
Atomic Force Microscope ◽  
Vertical Resolution ◽  
Contact Mode ◽  
Atomic Force ◽  
Elastic Approximation

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

2010 ◽  
Vol 110 (3) ◽  
pp. 254-258 ◽  
Author(s):  
Tathagata De ◽  
Antony M. Chettoor ◽  
Pranav Agarwal ◽  
Murti V. Salapaka ◽  
Saju Nettikadan
Keyword(s):  
Atomic Force Microscope ◽  
Yeast Cells ◽  
Contact Mode ◽  
Atomic Force ◽  
Intermittent Contact ◽  
Immobilization Method

scholarly journals Análisis de rugosidad y determinación de los desplazamientos en aleaciones de Níquel-Titanio mediante microscopia de fuerza atómica

2015 ◽  
Vol 3 (1) ◽  
pp. 4-8
Author(s):  
Edwin Fernando Mendoza Carreño ◽  
Arturo Plata Gómez
Keyword(s):  
Shape Memory ◽  
Atomic Force Microscope ◽  
Physical Property ◽  
Lateral Force ◽  
Austenite Phase ◽  
Final State ◽  
Contact Mode ◽  
Atomic Force ◽  
Roughness Analysis ◽  
Stimulus Temperature

Introducción: En este trabajo de investigación se analiza una aleación de Níquel (Ni) y Titanio (Ti). Este tipo de materiales poseen la propiedad Física de memoria de forma; la cual consiste en aplicarle una deformación inicial al material, este puede volver a su estado original aplicándole un estímulo externo (temperatura o fuerza). Materiales y métodos: Mediante la utilización de un Microscopio de Fuerza Atómica (AFM). Basados en la información suministrada por el AFM se obtuvieron datos de los desplazamientos que sufre el material utilizando regiones de muestreo de 1 x 1 micras. También, se realizó un análisis de la rugosidad del material, teniendo en cuenta la variación de la topografía a medida que se comprime la muestra. Resultados y Discusión: La transición en los materiales ocurre al pasar de una fase austenita a una fase martensitica cuando el material es sometido a una compresión siendo un estado final de la transformación más estable. Conclusiones: Cuando el AFM se emplea en modo de contacto permite observar como varía la topografía de la muestra lo cual determina el comportamiento de la rugosidad, evidenciada en una disminución del material a medida que se comprime y en el modo de contacto con fuerza lateral. Con el primero se logró observar la forma como rotan las partículas agrupadas en la superficie, cuando se le aplica una fuerza externa.Introduction: In this research an alloy of nickel (Ni) and Titanium (Ti) is analyzed. Such materials possess the physical property of shape memory; which consists of applying an initial deformation to the material, it can return to its original state by applying an external stimulus (temperature or power). Methods: Using an Atomic Force Microscope (AFM) and based on the information provided by the AFM data of displacement experienced by the material using sampling regions of 1 x 1 micron were obtained. Roughness analysis of the material, considering the topography variation as the sample is compressed was also carried out. Results and Discussion: The transition occurs in the material passing an austenite phase to a martensitic phase when the material is subjected to compression to be a final state of stable transformation. Conclusions: When the AFM is used in contact mode allows observing the change the topography of the sample which determine the behavior of the roughness, as evident in a decrease of material as it is compressed and in contact mode lateral force. With the former were able to observe how the grouped rotate on the surface, when an external force is applied particles. 

scholarly journals Fabrication of probe tips via the FIB method for nanodiagnostics of the surface of solids by atomic force microscopy

2021 ◽  
Vol 2086 (1) ◽  
pp. 012204
Author(s):  
D J Rodriguez ◽  
A V Kotosonova ◽  
H A Ballouk ◽  
N A Shandyba ◽  
O I Osotova ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Contact Mode ◽  
Ion Etching ◽  
Force Microscopy ◽  
Atomic Force

Abstract In this work, we carried out an investigation of commercial atomic force microscope (AFM) probes for contact and semi-contact modes, which were modified by focused ion beam (FIB). This method was used to modify the original tip shape of silicon AFM probes, by ion-etching and ion-enhance gas deposition. we show a better performance of the FIB-modified probes in contrast with the non-modified commercial probes. These results were obtained after using both probes in semi-contact mode in a calibration grating sample.

The Development of the "Terra AFM" Microscope

2014 ◽  
Vol 223 ◽  
pp. 299-307
Author(s):  
Sławomir Pawłowski ◽  
Grzegorz Dobiński ◽  
Marek Smolny ◽  
Andrzej Majcher ◽  
Andrzej Zbrowski ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Modular Design ◽  
Advanced Imaging ◽  
Contact Mode ◽  
Atomic Force ◽  
Advanced Technologies ◽  
Intermittent Contact

The article describes the development of the atomic force microscope “Terra AFM.” The microscope has been designed and built by the authors as a device for research applications in advanced technologies in industry and in teaching. The modular design of the microscope - the majority of mechanical, electronic and informatics solutions - facilitates the development and introduction of new functionality. Two new modules, correction of piezoelectric scanner nonlinearity and advanced imaging, using the measurement of the amplitude and phase of harmonics of the signal from the probe in the intermittent contact mode, are presented.

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