Angular dependence of the switching field of thin-film longitudinal and perpendicular magnetic recording media

2002 ◽  
Vol 92 (8) ◽  
pp. 4553-4559 ◽  
Author(s):  
Kevin R. Coffey ◽  
Thomas Thomson ◽  
Jan-Ulrich Thiele
Keyword(s):  
Thin Film ◽  
Angular Dependence ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Switching Field ◽  
Perpendicular Magnetic Recording

scholarly journals MAGNETIC PROPERTIES OF VACUUM EVAPORATED Co-O THIN FILM FOR PERPENDICULAR MAGNETIC RECORDING MEDIA

1989 ◽  
Vol 13 (S_1_PMRC_89) ◽  
pp. S1_813-818 ◽  
Author(s):  
Yasuo TATENO ◽  
Kazuharu IWASAKI ◽  
Hiroji NARUSE ◽  
Takuya ITOH ◽  
Ryoji CHUBACHI
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Perpendicular Magnetic Recording

Improvement of crystallographic characteristics of CoCrTa thin film using double underlayer

2001 ◽  
Vol 674 ◽  
Author(s):  
Y.J. Kim ◽  
S.H. Kong ◽  
S. Nakagawa ◽  
M. Naoe ◽  
K.H. Kim
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Magnetic Layer ◽  
Recording Media ◽  
Interlayer Thickness ◽  
Magnetic Recording Media ◽  
Axis Orientation ◽  
Perpendicular Magnetic Recording ◽  
High Density Recording ◽  
Crystallographic Characteristics

ABSTRACTHigh c-axis oriented CoCr-based thin films are expected for ultra-high density recording media in perpendicular magnetic recording system. In order to improve dispersion angle of c-axis of CoCr-based for perpendicular magnetic recording media, we prepared trilayered film with double underlayer using New Facing Targets Sputtering apparatus. The thickness of magnetic layer CoCrTa and double underlayer, such as interlayer Pt, paramagnetic CoCr, underlayer Ti was fixed 50nm and 20nm respectively. In order to prepare the thin film, we fixed argon gas pressure 1mTorr, substrate temperature 250°C and input current 0.5A. The crystallographic characteristics of CoCrTa layer with varying interlayer thickness (0- 20nm) have been investigated. By the result, the CoCrTa trilayered thin film with interlayer Pt showed good c-axis orientation 3.45° and 3.62° at thickness 5nm and 10nm respectively. However, CoCrTa thin film using interlayer paramagnetic CoCr showed 8.28° and 8.62° at thickness 5nm and 10nm respectively.

scholarly journals A study of perpendicular magnetic recording media using polarized SANS

2014 ◽  
Vol 70 (a1) ◽  
pp. C148-C148
Author(s):  
Stephen Lister ◽  
Vikash Venkataramana ◽  
Thomas Thomson ◽  
Joachim Kohlbrecher ◽  
Ken Takano ◽  
...  
Keyword(s):  
Thin Film ◽  
Data Storage ◽  
Magnetic Recording ◽  
Magnetic Moments ◽  
Magnetic Films ◽  
Oxide Shell ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Layer ◽  
Perpendicular Magnetic Recording

The study of thin film magnetic systems that are structured on the nanoscale is an area of intense interest. Small-angle neutron scattering is an extremely powerful probe of nanomagnetism in the bulk, but in thin-film systems the experiments are challenging due both to the small scattering volume available and also to scattering from other sources such as the substrate and sample environment. We have demonstrated that such experiments are however possible in magnetic films as thin as 10 nm. A good example to illustrate this is the case of perpendicular magnetic recording media. These materials are found in all modern magnetic hard drives, the data storage technology that continues to be of tremendous commercial and technological importance. These media are advanced functional multilayered materials, containing an active recording layer of only around 10 nm in thickness. This recording layer is compositionally segregated into 8 nm-sized grains of a magnetic CoCrPt alloy separated by a thin oxide shell, typically SiO2. These media have their magnetic moments oriented perpendicular to the plane of the film. Determining the local magnetic structure and reversal behavior is key to understanding the performance of perpendicular media in recording devices. Polarised SANS has proved to be a very effective tool to measure these materials at a sub-10nm length scales. The signal of interest must however also be distinguished from the scattering from other layers in the structure, some of which are also magnetic. We will present a summary of some recent results on recording media, including measurements of the grain-sized dependent switching with and without the presence of an exchange spring. We will also briefly mention experiments that demonstrate the viability of extending this approach to measurement for lithographically defined structures similar to those for application in bit-patterned media, including 2d artificial spin-ice and structurally glassy arrays.

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