Direct measurement of the absolute value of the interaction force between the fiber probe and the sample in a scanning near-field optical microscope

2002 ◽  
Vol 81 (8) ◽  
pp. 1503-1505 ◽  
Author(s):  
D. A. Lapshin ◽  
V. S. Letokhov ◽  
G. T. Shubeita ◽  
S. K. Sekatskii ◽  
G. Dietler
Keyword(s):  
Direct Measurement ◽  
Near Field ◽  
Interaction Force ◽  
Optical Microscope ◽  
Fiber Probe ◽  
Absolute Value ◽  
The Absolute

Scanning near-field optical microscope based on double-resonant fiber probe montage and its operation in liquids

2007 ◽  
Author(s):  
K. Dukenbayev ◽  
S. K. Sekatskii ◽  
D. V. Serebryakov ◽  
A. V. Zayats ◽  
G. Dietler
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Fiber Probe

FABRICATION OF SCANNING NEAR FIELD OPTICAL MICROSCOPE FIBER PROBE

2000 ◽  
pp. 188-192
Author(s):  
JIALIN SUN ◽  
QIN LI ◽  
ZIYANG WANG ◽  
YAN ZHANG ◽  
GUYIN RAO ◽  
...  
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Fiber Probe

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

2010 ◽  
Vol 132 (3) ◽  
Author(s):  
Zone-Ching Lin ◽  
Ming-Ho Chou
Keyword(s):  
Edge Effect ◽  
Experimental Measurement ◽  
Morse Potential ◽  
Standard Sample ◽  
Near Field ◽  
Surface Profile ◽  
Interaction Force ◽  
Optical Microscope ◽  
Atomic Interaction ◽  
Effect Of Surface

This study constructs a novel scanning near-field optical microscope (SNOM) fixed-amplitude simulative measuring model. It uses Al, Si, and O atoms to compose the probe tip and sample to construct the atomic model of SNOM simulative measuring model. It also applies Morse potential to calculate the atomic interaction force between tip and sample on the vibration theory of SNOM. This study compares the edge effect of surface profile between the simulated measurement with experimental measurement; it verifies that the nanoscale simulative measuring model for SNOM is reasonable and accurate. After analyzing the edge effect and error about the surface profile of standard sample by the SNOM simulated measurement, it is found that the factor influencing this surface profile appearance is mainly from the tip shapes. The investigation of the error analysis is referential in compensating the error of SNOM measurement and it can be used to further enhance the accuracy of SNOM measurement.

A new positioning approach of fiber probe for near-field scanning optical microscope

Optik ◽  
2006 ◽  
Vol 117 (6) ◽  
pp. 249-252
Author(s):  
Shi-Biao Xiang ◽  
Tian-Hao Zhang ◽  
Xu Xiang ◽  
Chun-Ping Zhang
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Fiber Probe ◽  
Near Field Scanning
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