Structural and dielectric characterization of the (Ba1−xSrx)(Ti0.9Sn0.1)O3 thin films deposited on Pt/Ti/SiO2/Si substrate by radio frequency magnetron sputtering

2002 ◽  
Vol 92 (4) ◽  
pp. 2100-2107 ◽  
Author(s):  
Moo-Chin Wang ◽  
Cheng-Chi Tsai ◽  
Nan-Chung Wu ◽  
Kun-Ming Hung
1997 ◽  
Vol 144 (8) ◽  
pp. 2855-2858 ◽  
Author(s):  
Sang‐Shik Park ◽  
Cheol‐Hoon Yang ◽  
Soon‐Gil Yoon ◽  
Jun‐Hyung Ahn ◽  
Ho‐Gi Kim

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