A laser ablation electron impact ionization time-of-flight mass spectrometer for analysis of condensed materials

2002 ◽  
Vol 73 (8) ◽  
pp. 3003-3006 ◽  
Author(s):  
F. Drewnick ◽  
P. H. Wieser
Keyword(s):  
Laser Ablation ◽  
Electron Impact ◽  
Mass Spectrometer ◽  
Impact Ionization ◽  
Time Of Flight ◽  
Electron Impact Ionization ◽  
Ionization Time ◽  
Flight Mass Spectrometer ◽  
Condensed Materials

Laser-induced electron impact ionization in a reflectron time-of-flight mass spectrometer

1993 ◽  
Vol 28 (12) ◽  
pp. 1467-1475 ◽  
Author(s):  
F. Moritz ◽  
M. Dey ◽  
K. Zipperer ◽  
S. Prinke ◽  
J. Grotemeyer
Keyword(s):  
Electron Impact ◽  
Mass Spectrometer ◽  
Impact Ionization ◽  
Time Of Flight ◽  
Electron Impact Ionization ◽  
Flight Mass Spectrometer
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