An analytical solution for microtip field emission current and effective emission area

2002 ◽  
Vol 91 (11) ◽  
pp. 9379-9384 ◽  
Author(s):  
J. D. Zuber ◽  
K. L. Jensen ◽  
T. E. Sullivan
Keyword(s):  
Analytical Solution ◽  
Field Emission ◽  
Emission Current ◽  
Emission Area ◽  
Field Emission Current ◽  
Effective Emission Area

The Role of STM Tip Shape in Heat Assisted Magnetic Probe Recording on CONI/PT Film

2004 ◽  
Author(s):  
Li Zhang ◽  
James A. Bain ◽  
Jian-Gang Zhu ◽  
Leon Abelmann ◽  
Takahiro Onoue
Keyword(s):  
Field Emission ◽  
Pulse Voltage ◽  
Emission Current ◽  
Scanning Tunneling ◽  
Emission Region ◽  
Heating Source ◽  
Emission Area ◽  
Field Emission Current ◽  
Pt Alloy ◽  
Tip Radius

A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3–7 V with a duration of 500 ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000 nm), marks are formed with a nearly uniform mark size of 170 nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tip-sample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.

Critical fluctuations of the field emission current

1994 ◽  
Vol 317 (1-2) ◽  
pp. 253-258 ◽  
Author(s):  
E.S. Shikhovtseva ◽  
K. Skwarek ◽  
J. Bȩben
Keyword(s):  
Field Emission ◽  
Emission Current ◽  
Critical Fluctuations ◽  
Field Emission Current

Measurement of field emission current variations caused by an amplitude modulated laser

2002 ◽  
Vol 327 (1) ◽  
pp. 7-15 ◽  
Author(s):  
M Brugat ◽  
M.S Mousa ◽  
E.P Sheshin ◽  
M.J Hagmann
Keyword(s):  
Field Emission ◽  
Emission Current ◽  
Field Emission Current

scholarly journals Relativistic Correction of the Field Emission Current in the Fowler-Nordheim Formalism

2019 ◽  
Vol 11 (2) ◽  
pp. 02022-1-02022-6 ◽  
Author(s):  
S. O. Lebedynskyi ◽  
◽  
O. O. Pasko ◽  
R. I. Kholodov ◽  
◽  
...  
Keyword(s):  
Field Emission ◽  
Relativistic Correction ◽  
Emission Current ◽  
Field Emission Current

Stable field-emission from a CeB6 nanoneedle point electron source

Nanoscale ◽  
2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Yimeng Wu ◽  
You-Hu Chen ◽  
Jun Uzuhashi ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Emission Current ◽  
Field Emission Current ◽  
Stable Field ◽  
Single Emission

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.

Impact of inrush current on field emission current and voltage distribution in series vacuum gaps

2019 ◽  
Vol 26 (1) ◽  
pp. 162-170 ◽  
Author(s):  
Feng Zhao ◽  
Yingyao Zhang ◽  
He Yang ◽  
Hongtu Xue ◽  
Yingsan Geng ◽  
...  
Keyword(s):  
Field Emission ◽  
Emission Current ◽  
Inrush Current ◽  
Voltage Distribution ◽  
Field Emission Current ◽  
In Series ◽  
Vacuum Gaps

Field emission current noise analysis of carbon based materials

2012 ◽  
Author(s):  
Mahendra A. More ◽  
Ranjit V. Kashid ◽  
Sandip S. Patil ◽  
Deodatta R. Shinde ◽  
Dilip S. Joag
Keyword(s):  
Field Emission ◽  
Noise Analysis ◽  
Emission Current ◽  
Current Noise ◽  
Field Emission Current ◽  
Carbon Based
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