A device for surface study of confined micron thin films in a total internal reflection geometry
2002 ◽
Vol 73
(6)
◽
pp. 2321-2324
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Keyword(s):
Keyword(s):
2000 ◽
Vol 2
(2)
◽
pp. 117-120
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2013 ◽
Vol 46
(10)
◽
pp. 105501
◽
2020 ◽
Vol 412
(24)
◽
pp. 6009-6022
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