Anomalous dielectric relaxation in the context of the Debye model of noninertial rotational diffusion

2002 ◽  
Vol 116 (15) ◽  
pp. 6422-6426 ◽  
Author(s):  
W. T. Coffey ◽  
Yu. P. Kalmykov ◽  
S. V. Titov
Keyword(s):  
Dielectric Relaxation ◽  
Rotational Diffusion ◽  
Debye Model

The Application of the Memory-Function Formalism to Dielectric Relaxation

1980 ◽  
Vol 35 (11) ◽  
pp. 1207-1217
Author(s):  
P. Bordewijk
Keyword(s):  
Correlation Function ◽  
Dielectric Relaxation ◽  
Single Molecule ◽  
Rotational Diffusion ◽  
Memory Function ◽  
Dielectric Relaxation Time ◽  
Function Formalism ◽  
Correlation Theorem ◽  
Dipole Correlation ◽  
Rotational Diffusion Coefficient

Abstract The application of the memory-function formalism to dielectric relaxation is reconsidered. It is shown that the so-called Corresponding Micro-Macro Correlation theorem is not valid and that for a single macroscopic dielectric relaxation time, the single-molecule dipole correlation function may nevertheless be non-exponential. The deviations from the exponential decay for the single-molecule dipole correlation function are due to spatially dependent orientational correlations, and can at least partly be interpreted in terms of dielectric friction. The unsureness about these correlations implies that it is simpler to determine the rotational diffusion coefficient from the collective orientation correlation time as determined from dielectric measurements than from the single-molecule dipole correlation function as obtained from infrared spectroscopy.

scholarly journals Non-Debye vs. Debye Dielectric Relaxation: How Does Memory Effect Arise?

Proceedings ◽  
2019 ◽  
Vol 26 (1) ◽  
pp. 43
Author(s):  
Lattanzi ◽  
Górska ◽  
Horzela
Keyword(s):  
Statistical Mechanics ◽  
Dielectric Relaxation ◽  
Memory Effect ◽  
Debye Model ◽  
Relaxation Phenomena

The Debye model presents an essential and elegant description for the relaxation phenomena based on statistical mechanics. [...]

scholarly journals Parameterization of Debye Model for Dielectrics Using Voltage Response Measurements and a Benchmark Problem

2021 ◽  
Author(s):  
Ehtasham Mustafa ◽  
Regina Mária Németh ◽  
Ramy S. A. Afia ◽  
Zoltán Ádám Tamus
Keyword(s):  
Dielectric Relaxation ◽  
Nonlinear Function ◽  
Debye Model ◽  
Voltage Response ◽  
Polarization Spectrum ◽  
Relaxation Processes ◽  
Diagnostic Purpose ◽  
Response Measurement ◽  
Function Fitting ◽  
Response Method

The Voltage Response measurement since its introduction in the 1960s has been used successfully for the diagnostics of electrical insulation. The method is based on two quantities of decay and return voltage slopes and can be used to study the conduction and polarization processes inside the insulation. Extended Voltage Response method, being an advanced version of the Voltage Response measurement helps in further studying the polarization process by using a large polarization spectrum and hence dielectric relaxation processes. These dielectric relaxation processes can be modeled by the Debye model. Since as most of the techniques used for diagnostic purpose does not give the information about the conduction and polarization processes separately, it is difficult to determine the R-C parameters of the Debye model. The Voltage Response technique is very useful in this regard because of the two voltage slopes. The paper shows a novel experimental benchmark for testing the function fitting methodologies of the Voltage Response methodologies, which helps in determining the R-C parameters. Moreover, the problem can be used for testing the novel genetic, evolutionary algorithms, where benchmarking is an actual challenge. The proposed nonlinear function fitting method uses the genetic algorithms via the Ārtap framework, which lets it possible to select the most accurate optimization algorithm from the provided list of the algorithms and achieve better fitting precision, faster calculation time or more powerful processing ability.

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