Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure

2002 ◽  
Vol 80 (10) ◽  
pp. 1806-1808 ◽  
Author(s):  
M. Shvebelman ◽  
P. Urenski ◽  
R. Shikler ◽  
G. Rosenman ◽  
Y. Rosenwaks ◽  
...  
Keyword(s):  
Domain Structure ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Domain ◽  
Scanning Probe ◽  
Periodically Poled ◽  
Probe Microscopy ◽  
Ferroelectric Domain Structure

Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

2003 ◽  
Vol 82 (1) ◽  
pp. 103-105 ◽  
Author(s):  
G. Rosenman ◽  
P. Urenski ◽  
A. Agronin ◽  
Y. Rosenwaks ◽  
M. Molotskii
Keyword(s):  
High Voltage ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Domain ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Domain Structures ◽  
Voltage Scanning

scholarly journals Quantitative analysis of the direct piezoelectric response of bismuth ferrite films by scanning probe microscopy

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Kento Kariya ◽  
Takeshi Yoshimura ◽  
Katsuya Ujimoto ◽  
Norifumi Fujimura
Keyword(s):  
Quantitative Analysis ◽  
Domain Structure ◽  
Scanning Probe Microscopy ◽  
Domain Walls ◽  
Piezoelectric Properties ◽  
Bismuth Ferrite ◽  
Scanning Probe ◽  
Piezoelectric Response ◽  
Probe Microscopy ◽  
Piezoelectric Force Microscopy

AbstractPolarisation domain structure is a microstructure specific to ferroelectrics and plays a role in their various fascinating characteristics. The piezoelectric properties of ferroelectrics are influenced by the domain wall contribution. This study provides a direct observation of the contribution of domain walls to the direct piezoelectric response of bismuth ferrite (BiFeO3) films, which have been widely studied as lead-free piezoelectrics. To achieve this purpose, we developed a scanning probe microscopy-based measurement technique, termed direct piezoelectric response microscopy (DPRM), to observe the domain structure of BiFeO3 films via the direct piezoelectric response. Quantitative analysis of the direct piezoelectric response obtained by DPRM, detailed analysis of the domain structure by conventional piezoelectric force microscopy, and microscopic characterisation of the direct piezoelectric properties of BiFeO3 films with different domain structures revealed that their direct piezoelectric response is enhanced by the walls between the domains of spontaneous polarisation in the same out-of-plane direction.

Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy

1999 ◽  
Vol 222 (1) ◽  
pp. 153-162 ◽  
Author(s):  
L. M. Eng ◽  
M. Bammerlin. Ch. Loppacher ◽  
M. Guggisberg. R. Bennewitz ◽  
R. Lüthi ◽  
E. Meyer. Th. Huser ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Ferroelectric Domain ◽  
Scanning Probe ◽  
Probe Microscopy

Study of Nanoscale Domain Structure and Elastic Response of Lead-Free Piezoelectric Ceramics by Scanning Probe Microscopy

2013 ◽  
Vol 442 (1) ◽  
pp. 123-130 ◽  
Author(s):  
K. Y. Zhao ◽  
F. Sun ◽  
H. R. Zeng ◽  
L. Y. Zheng ◽  
J. T. Zeng ◽  
...  
Keyword(s):  
Domain Structure ◽  
Scanning Probe Microscopy ◽  
Piezoelectric Ceramics ◽  
Scanning Probe ◽  
Lead Free ◽  
Elastic Response ◽  
Probe Microscopy
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