Effect of soft-phase anisotropy on reversal behavior in two-phase exchange-coupled bilayer ferromagnetic thin films

2002 ◽  
Vol 91 (10) ◽  
pp. 7212 ◽  
Author(s):  
D. C. Crew
Keyword(s):  
Thin Films ◽  
Phase Anisotropy ◽  
Two Phase ◽  
Soft Phase ◽  
Ferromagnetic Thin Films

Wall Streaming in Ferromagnetic Thin Films

1967 ◽  
Vol 38 (11) ◽  
pp. 4401-4408 ◽  
Author(s):  
K. U. Stein ◽  
E. Feldtkeller
Keyword(s):  
Thin Films ◽  
Ferromagnetic Thin Films

Characterization of the order-annealing response of nanostructured iron-palladium based ferromagnetic thin-films

2001 ◽  
Vol 703 ◽  
Author(s):  
Huiping Xu ◽  
Adam T. Wise ◽  
Timothy J. Klemmer ◽  
Jörg M. K. Wiezorek
Keyword(s):  
Thin Films ◽  
Grain Growth ◽  
Room Temperature ◽  
Si Substrate ◽  
Ferromagnetic Thin Films ◽  
Precipitation Reactions ◽  
Post Deposition ◽  
Xrd And Tem ◽  
Iron Palladium

ABSTRACTA combination of XRD and TEM techniques have been used to characterize the response of room temperature magnetron sputtered Fe-Pd thin films on Si-susbtrates to post-deposition order-annealing at temperatures between 400-500°C. Deposition produced the disordered Fe-Pd phase with (111)-twinned grains approximately 18nm in size. Ordering occurred for annealing at 450°C and 500°C after 1.8ks, accompanied by grain growth (40-70nm). The ordered FePd grains contained (111)-twins rather than {101}-twins typical of bulk ordered FePd. The metallic overlayers and underlayers selected here produced detrimental dissolution (Pt into Fe-Pd phases) and precipitation reactions between Pd and the Si substrate.

Excitation and damping of spin excitations in ferromagnetic thin films

2002 ◽  
Vol 241 (1) ◽  
pp. 96-109 ◽  
Author(s):  
J. Wu ◽  
N.D. Hughes ◽  
J.R. Moore ◽  
R.J. Hicken
Keyword(s):  
Thin Films ◽  
Ferromagnetic Thin Films ◽  
Spin Excitations

Magnetic memory in ferromagnetic thin films via exchange coupling

2008 ◽  
Vol 78 (13) ◽  
Author(s):  
K. Chesnel ◽  
E. E. Fullerton ◽  
M. J. Carey ◽  
J. B. Kortright ◽  
S. D. Kevan
Keyword(s):  
Thin Films ◽  
Exchange Coupling ◽  
Magnetic Memory ◽  
Ferromagnetic Thin Films

Inertial spin dynamics in ferromagnetic thin films

2021 ◽  
Author(s):  
Kumar Neeraj ◽  
Nilesh Awari ◽  
Sergey Kovalev ◽  
Debanjan Polley ◽  
Nanna Zhou Hagström ◽  
...  
Keyword(s):  
Thin Films ◽  
Spin Dynamics ◽  
Ferromagnetic Thin Films

Structure Characteristics of TiO2 Thin Films Prepared by DC Reactive Magnetron Sputtering at Low Pressure

2021 ◽  
Vol 19 (4) ◽  
pp. 77-86
Author(s):  
A.S. Ahmed ◽  
I.H. Kadim ◽  
A.A. Ramadhan
Keyword(s):  
Thin Films ◽  
Total Pressure ◽  
Great Influence ◽  
Dissociative Adsorption ◽  
Interplanar Distance ◽  
Main Role ◽  
Tio2 Thin Films ◽  
Two Phase ◽  
Adsorption Of Water ◽  
Standard Value

Structural properties of TiO2 thin films play a main role in determine the characteristic of the thin films especially their stability and activity, the total pressure has a great influence in determine the crystallinity of the films and the orientation of the facets of their structure, especially the two facet (101) and (001), the enhancing the structure properties will cause to enhance the application efficiency of TiO2 thin films such as the dissociative adsorption of water and the solar cell. Many researcher interest to prepare the TiO2 thin film under the low range of total pressure (less than to 10 Pa) to avoid the low degree of crystalline and the mixed of two phase anatas and rutile, so in our work tend to prepare TiO2 thin films under a high total pressure (more than 10 Pa) with values (10, 20, 50 and 100) Pa and with (1:1) mixed ratio of Argon and Oxygen gases, the pattern of X-Ray diffraction revealed that the structure was polycrystalline and the phase was anatas. The intensity at 2θ ≈ 25.00°, 37.00°, 53.00° and 55.00° correspond to the diffraction from (101), (004), (105) and (211) planes respectively. The intensity and number of peaks decreased with increased the total pressure, the plane (101) could be considered as a prefential growth plane which take a high texture factor and this would decreased with increased the total pressure, the ratio of texture factor between 001 and 101 will increase with decrease the total pressure, The lattice constant and the interplanar distance displayed a greater deviation compared with the standard value at the lowest total pressure than the decrease observed with increased total pressure.

Evaporation of Ferromagnetic Thin Films

JOM ◽  
1962 ◽  
Vol 14 (3) ◽  
pp. 208-213
Author(s):  
K. H. Behrndt
Keyword(s):  
Thin Films ◽  
Ferromagnetic Thin Films
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