Ultrahigh vacuum scanning tunneling microscopy/magnetic force microscopy study of ultrathin iron films grown on polycrystalline nickel oxide films

2002 ◽  
Vol 91 (10) ◽  
pp. 8138 ◽  
Author(s):  
M. Dreyer ◽  
D. G. Hwang ◽  
R. D. Gomez
Keyword(s):  
Nickel Oxide ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Microscopy Study ◽  
Scanning Tunneling ◽  
Polycrystalline Nickel ◽  
Tunneling Microscopy ◽  
Iron Films ◽  
Force Microscopy ◽  
Nickel Oxide Films

scholarly journals qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

2012 ◽  
Vol 3 ◽  
pp. 174-178 ◽  
Author(s):  
Maximilian Schneiderbauer ◽  
Daniel Wastl ◽  
Franz J Giessibl
Keyword(s):  
Domain Structure ◽  
Magnetic Dipole ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Scanning Tunneling ◽  
Atomic Interaction ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Dipole Interactions ◽  
Single Probe

Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the alignment of the individual atomic magnetic moments. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the force gradients of the interactions responsible for atomic contrast and those causing domain contrast are orders of magnitude apart, ranging from up to 100 Nm−1 for atomic interactions down to 0.0001 Nm−1 for magnetic dipole interactions. Here, we show that this gap can be bridged with a qPlus sensor, with a stiffness of 1800 Nm−1 (optimized for atomic interaction), which is sensitive enough to measure millihertz frequency contrast caused by magnetic dipole–dipole interactions. Thus we have succeeded in establishing a sensing technique that performs scanning tunneling microscopy, atomic force microscopy and MFM with a single probe.

Tunneling stabilized magnetic-force microscopy

1993 ◽  
Vol 51 ◽  
pp. 1034-1035
Author(s):  
John Moreland
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Sample Surface ◽  
Image Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Garnet Films ◽  
Simple Change ◽  
Superconductor Films

Magnetic force microscopy (MFM) can be done by making a simple change in conventional scanning tunneling microscopy (STM) where the usual rigid STM tip is replaced with a flexible magnetic tip. STM images acquired this way show both the topography and the magnetic forces acting on the flexible tip. The z-motion of the STM piezo tube scanner flexes the tip to balance the magnetic force so that the end of the tip remains a fixed tunneling distance from the sample surface. We present a review of some “tunneling-stabilized” MFM (TSMFM) images showing magnetic bit tracks on a hard disk, Bloch wall domains in garnet films, and flux patterns in high-Tc superconductor films. The image resolution of TSMFM is routinely 0.1 μm using Au coated magnetic tips cut from Ni or Fe films. Recent results show that a TSMFM resolution of less than 40 nm is possible with micromachined cantilevers coated with a very thin Au-Fe bilayer.

Magnetic Force Microscopy Study of the Effect of Stresses on the Magnetic State of Ni Particles

2019 ◽  
Vol 61 (9) ◽  
pp. 1572-1576 ◽  
Author(s):  
O. L. Ermolaeva ◽  
N. S. Gusev ◽  
E. V. Skorokhodov ◽  
V. V. Rogov ◽  
O. G. Udalov
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic State ◽  
Microscopy Study ◽  
Force Microscopy

scholarly journals Magnetic force microscopy study of magnetization reversal in sputtered FeSiAl(N) films

2001 ◽  
Vol 89 (5) ◽  
pp. 2868-2872 ◽  
Author(s):  
C. C. H. Lo ◽  
J. E. Snyder ◽  
J. Leib ◽  
R. Chen ◽  
B. Kriegermeier-Sutton ◽  
...  
Keyword(s):  
Magnetization Reversal ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Microscopy Study ◽  
Force Microscopy

A magnetic force microscopy study of the magnetic reversal of a single Fe nanowire

2009 ◽  
Vol 20 (10) ◽  
pp. 105707 ◽  
Author(s):  
T Wang ◽  
Y Wang ◽  
Y Fu ◽  
T Hasegawa ◽  
F S Li ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Microscopy Study ◽  
Magnetic Reversal ◽  
Force Microscopy
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