High-resolution Fourier transform infrared and cw-diode laser cavity ringdown spectroscopy of the ν2+2ν3 band of methane near 7510 cm−1 in slit jet expansions and at room temperature

2002 ◽  
Vol 116 (14) ◽  
pp. 6045-6055 ◽  
Author(s):  
Michael Hippler ◽  
Martin Quack
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Diode Laser ◽  
Room Temperature ◽  
Laser Cavity ◽  
Fourier Transform Infrared ◽  
Cavity Ringdown Spectroscopy ◽  
Cavity Ringdown

Measurement of trace gases by diode laser cavity ringdown spectroscopy

1999 ◽  
Author(s):  
Daniele Romanini ◽  
Alexander A. Kachanov ◽  
Jerome Morville ◽  
Marc Chenevier
Keyword(s):  
Diode Laser ◽  
Trace Gases ◽  
Laser Cavity ◽  
Cavity Ringdown Spectroscopy ◽  
Cavity Ringdown

High-resolution Fourier-transform infrared spectroscopy of the Coriolis coupled ground state and ν7 mode of ketenimine

2011 ◽  
Vol 134 (23) ◽  
pp. 234306 ◽  
Author(s):  
Michael K. Bane ◽  
Evan G. Robertson ◽  
Christopher D. Thompson ◽  
Chris Medcraft ◽  
Dominique R. T. Appadoo ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Infrared Spectroscopy ◽  
High Resolution ◽  
Fourier Transform Infrared Spectroscopy ◽  
Ground State ◽  
Fourier Transform Infrared

Low Temperature Evaluation of Carbon and Oxygen Contaminants in Silicon

1980 ◽  
Vol 34 (2) ◽  
pp. 171-173 ◽  
Author(s):  
D. G. Mead
Keyword(s):  
Fourier Transform ◽  
Low Temperature ◽  
Room Temperature ◽  
Fourier Transform Infrared ◽  
Spectral Subtraction ◽  
Atomic Carbon ◽  
Infrared Measurements ◽  
Oxygen Concentrations

Low temperature Fourier transform infrared measurements at 20 K on some wafers containing substitutional atomic carbon and oxygen are presented. Spectral subtraction techniques at 20 K indicate an increase of approximately 5 times in sensitivity compared to the room temperature evaluation of the carbon and oxygen concentrations.

Broadband terahertz dielectric measurement based on multi-beam interference and Fourier transform infrared spectrometer

2018 ◽  
Vol 32 (25) ◽  
pp. 1850298
Author(s):  
Jie Shi ◽  
Mao-Rong Wang ◽  
Kai Zhong ◽  
Chu Liu ◽  
Jia-Lin Mei ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Room Temperature ◽  
Fourier Transform Infrared ◽  
Refraction Index ◽  
Good Alternative ◽  
Dielectric Measurement ◽  
Terahertz Time Domain Spectroscopy ◽  
Fourier Transform Infrared Spectrometer ◽  
Limited Frequency ◽  
Infrared Spectrometer

We demonstrate a method for obtaining optical coefficients over a broad terahertz spectral range from 1.5 THz to 16 THz at room temperature. Based on the interferograms directly acquired by a Fourier transform infrared spectrometer (FTIR), multi-beam interference principle combining Fresnel’s formula is employed to extract the refraction index and the extinction coefficient, giving the basis for calculating dielectric coefficients. It avoids the uncertainty and phase instability while using Kramers–Kronig (KK) relations and overcomes the limited frequency range of terahertz time-domain spectroscopy (TDS). Moreover, this method has better stability and is needless of cutting useful information between neighboring interference peaks for thin samples compared with TDS, making it a general processing method for interferograms and a good alternative for terahertz dielectric measurement.

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