Characterization of thin film electron emitters by scanning anode field emission microscopy

L. Nilsson; O. Groening; P. Groening; O. Kuettel; L. Schlapbach

doi:10.1063/1.1379559

Characterization of thin film electron emitters by scanning anode field emission microscopy

Journal of Applied Physics ◽

10.1063/1.1379559 ◽

2001 ◽

Vol 90 (2) ◽

pp. 768-780 ◽

Cited By ~ 75

Author(s):

L. Nilsson ◽

O. Groening ◽

P. Groening ◽

O. Kuettel ◽

L. Schlapbach

Keyword(s):

Thin Film ◽

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Electron Emitters

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Characterization of the conductivity of organic thiols by field emission microscopy and field emission spectroscopy

Journal of the American Chemical Society ◽

10.1021/ja00105a045 ◽

1994 ◽

Vol 116 (26) ◽

pp. 11985-11989 ◽

Cited By ~ 19

Author(s):

S. T. Purcell ◽

N. Garcia ◽

Vu Thien Binh ◽

L. Jones ◽

J. M. Tour

Keyword(s):

Field Emission ◽

Emission Spectroscopy ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Organic Thiols

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Nanoscale characterization of an electron emitting tip by field emission microscopy and scanning probe microscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4930308 ◽

2015 ◽

Vol 33 (5) ◽

pp. 051809 ◽

Cited By ~ 1

Author(s):

Norimichi Watanabe ◽

Miyuki Tanaka ◽

Tetsuo Shimizu

Keyword(s):

Field Emission ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Field Emission Microscopy ◽

Emission Microscopy

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Field-emission microscopy

AccessScience ◽

10.1036/1097-8542.256210 ◽

2015 ◽

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy

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Preliminary study of KCl by field-emission microscopy

Surface Science ◽

10.1016/0039-6028(71)90194-4 ◽

1971 ◽

Vol 27 (3) ◽

pp. 635-644 ◽

Cited By ~ 8

Author(s):

Fumio Okuyama

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Preliminary Study ◽

Emission Microscopy

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Field emission microscopy study of silver adsorption on tungsten single-crystal planes

Thin Solid Films ◽

10.1016/0040-6090(82)90459-x ◽

1982 ◽

Vol 97 (3) ◽

pp. 245-257 ◽

Cited By ~ 2

Author(s):

Cr. Conţescu ◽

M.I. Vass

Keyword(s):

Single Crystal ◽

Field Emission ◽

Microscopy Study ◽

Tungsten Single Crystal ◽

Field Emission Microscopy ◽

Emission Microscopy

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Field emission microscopy study of surface self diffusion and crystal growth of refractory metals in high electric fields

Vacuum ◽

10.1016/0042-207x(86)90343-x ◽

1986 ◽

Vol 36 (10) ◽

pp. 701

Keyword(s):

Crystal Growth ◽

Field Emission ◽

Electric Fields ◽

Microscopy Study ◽

Refractory Metals ◽

Self Diffusion ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

High Electric Fields

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Scanning Field Emission Microscopy with Spin and Energy Analysis

10.1109/ivnc52431.2021.9600781 ◽

2021 ◽

Cited By ~ 1

Author(s):

A-K Thamm ◽

J. Wei ◽

M. Demydenko ◽

C. G. H. Walker ◽

D. Pescia ◽

...

Keyword(s):

Field Emission ◽

Energy Analysis ◽

Field Emission Microscopy ◽

Emission Microscopy

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Collector dependence of field emission in the Scanning Field Emission Microscopy

10.1109/ivnc52431.2021.9600714 ◽

2021 ◽

Author(s):

H. J. Gotsis ◽

N. C. Bacalis ◽

J. P. Xanthakis

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy

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Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.5140602 ◽

2020 ◽

Vol 38 (2) ◽

pp. 024006 ◽

Cited By ~ 1

Author(s):

Taha Y. Posos ◽

Steven B. Fairchild ◽

Jeongho Park ◽

Sergey V. Baryshev

Keyword(s):

Carbon Nanotube ◽

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Carbon Nanotube Fibers

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Field Desorption by Alternating Fields. An Improved Technique for Field Emission Microscopy

Review of Scientific Instruments ◽

10.1063/1.1716183 ◽

1958 ◽

Vol 29 (4) ◽

pp. 309-312 ◽

Cited By ~ 31

Author(s):

Earl C. Cooper ◽

Erwin W. Müller

Keyword(s):

Field Emission ◽

Field Desorption ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Improved Technique

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