Thickness dependence of surface roughness and transport properties of La2/3Ca1/3MnO3 epitaxial thin films

2001 ◽  
Vol 89 (11) ◽  
pp. 6686-6688 ◽  
Author(s):  
M. Bibes ◽  
Ll. Balcells ◽  
S. Valencia ◽  
S. Sena ◽  
B. Martı́nez ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Transport Properties ◽  
Thickness Dependence ◽  
Epitaxial Thin Films

Structural, magnetic, and transport properties of Fe-doped CoTiSb epitaxial thin films

2015 ◽  
Vol 118 (17) ◽  
pp. 173905 ◽  
Author(s):  
N. Y. Sun ◽  
Y. Q. Zhang ◽  
W. R. Che ◽  
J. Qin ◽  
R. Shan
Keyword(s):  
Thin Films ◽  
Transport Properties ◽  
Epitaxial Thin Films

Preparation and transport properties of Nb1−xCrxN epitaxial thin films on silicon wafers

2003 ◽  
Vol 328 (1-2) ◽  
pp. 123-124 ◽  
Author(s):  
Kei Inumaru ◽  
Koyo Sakamoto ◽  
Hiroshi Okamoto ◽  
Shoji Yamanaka
Keyword(s):  
Thin Films ◽  
Transport Properties ◽  
Silicon Wafers ◽  
Epitaxial Thin Films

Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD–PEEM

2007 ◽  
Vol 601 (20) ◽  
pp. 4690-4693 ◽  
Author(s):  
Toshiyuki Taniuchi ◽  
Ryutaro Yasuhara ◽  
Hiroshi Kumigashira ◽  
Masato Kubota ◽  
Hiroyuki Okazaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Domain ◽  
Thickness Dependence ◽  
Epitaxial Thin Films ◽  
Domain Formation

Electrical transport properties of Ag-doped p-type PbTe epitaxial thin films

1981 ◽  
Vol 68 (1) ◽  
pp. 227-232 ◽  
Author(s):  
A. L. Dawar ◽  
S. K. Paradkar ◽  
P. Kumar ◽  
O. P. Taneja ◽  
P. C. Mathur
Keyword(s):  
Thin Films ◽  
Transport Properties ◽  
Electrical Transport ◽  
Epitaxial Thin Films ◽  
Electrical Transport Properties ◽  
P Type

CHARACTERIZATION OF Bi2Te3 THIN FILMS FOR APPLICATION IN MICRO-THERMO ELECTRIC COOLERS

2006 ◽  
Vol 20 (25n27) ◽  
pp. 4063-4068 ◽  
Author(s):  
SEUNG WOO HAN ◽  
MD ANWARUL HASAN ◽  
KI-HO CHO ◽  
HAK JOO LEE ◽  
DONG-HO KIM ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Substrate Temperature ◽  
Transport Properties ◽  
Electrical Transport ◽  
Ion Beam ◽  
Test Method ◽  
Nanoindentation Test ◽  
Electrical Transport Properties ◽  
Thermo Electric

In this study we have characterized the mechanical and electrical properties of Bi 2 Te 3 thin films prepared by co-sputtering method. The film structure and morphology were revealed using the X-ray diffraction and scanning electron microscopy (SEM). Thickness of the deposited films was measured using SEM observation after FIB (Focused Ion Beam) milling, and the surface roughness of the films was analyzed using AFM (atomic force microscopy). Electrical transport properties were measured with a Hall effect measurement system, while the mechanical properties were evaluated using nanoindentation test method. Results showed that Bi 2 Te 3 thin films have amorphous structure at lower film thicknesses, but as the thickness increases the structure becomes polycrystalline. Surface roughness and crystal size of the films increased with increase in substrate temperature. Films showed higher elastic modulus and hardness values compared to those of the bulk Bi 2 Te 3 alloy. The electrical transport properties of the films were also affected by the substrate temperature.

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