Long-range Coulomb interactions in small Si devices. Part II. Effective electron mobility in thin-oxide structures
Keyword(s):
Keyword(s):
2002 ◽
Vol 71
(8)
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pp. 1824-1827
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Keyword(s):
2014 ◽
Vol 61
(11)
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pp. 3601-3607
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1993 ◽
Vol 70
(20)
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pp. 3123-3126
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2002 ◽
Vol 41
(Part 1, No. 7A)
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pp. 4521-4522
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1993 ◽
Vol 71
(2)
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pp. 306-306
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