Optical characterization of plasma facing mirrors for a Thomson scattering system of a burning plasma experiment

2001 ◽  
Vol 72 (1) ◽  
pp. 540-544 ◽  
Author(s):  
F. P. Orsitto ◽  
D. Del Bugaro ◽  
M. DiFino ◽  
A. Maiolo ◽  
M. Montecchi ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Thomson Scattering ◽  
Scattering System ◽  
Burning Plasma ◽  
Plasma Experiment

Crystal Growth and Electro-optical Characterization of In2Se2.7Sb0.3 Compound

2020 ◽  
Vol 12 (4) ◽  
pp. 04022-1-04022-4
Author(s):  
Piyush Patel ◽  
◽  
S. M. Vyas ◽  
Vimal Patel ◽  
Himanshu Pavagadhi ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Optical Characterization

Optical Characterization of Monodispersed Aaqueous Cu2+-Doped CdS Nanoparticles Prepared Under Microwave Irradiation Conditions

2014 ◽  
Vol 01 (999) ◽  
pp. 1-1
Author(s):  
Wei Zhu ◽  
Qihui Shen ◽  
Xinjian Bao ◽  
Xiao Bai ◽  
Tingting Li ◽  
...  
Keyword(s):  
Microwave Irradiation ◽  
Optical Characterization ◽  
Cds Nanoparticles

Application of Kubelka-Munk model on the optical characterization of translucent dental zirconia

2021 ◽  
Vol 258 ◽  
pp. 123994
Author(s):  
Luciana M. Schabbach ◽  
Bruno C. dos Santos ◽  
Letícia S. De Bortoli ◽  
Márcio Celso Fredel ◽  
Bruno Henriques
Keyword(s):  
Optical Characterization

scholarly journals Magneto-optical characterization of ZnO / Ni nano-laminate obtained via Atomic Layer Deposition

2021 ◽  
Vol 1762 (1) ◽  
pp. 012041
Author(s):  
K Buchkov ◽  
A Galluzzi ◽  
B Blagoev ◽  
A Paskaleva ◽  
P Terziyska ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Optical Characterization ◽  
Layer Deposition

Optical characterization of laterally and vertically structured oxides and semiconductors

2014 ◽  
Author(s):  
P. Petrik ◽  
N. Kumar ◽  
E. Agocs ◽  
B. Fodor ◽  
S. F. Pereira ◽  
...  
Keyword(s):  
Optical Characterization

Optical characterization of hybrid PEDOT:PSS/Si heterostructures by spectroscopic ellipsometry

2021 ◽  
Vol 717 (1) ◽  
pp. 92-97
Author(s):  
O. S. Kondratenko ◽  
S. V. Mamykin ◽  
T. S. Lunko ◽  
I. B. Mamontova ◽  
V. R. Romanyuk
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Characterization
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