Structural evolution and optical properties of TiO[sub 2] thin films prepared by thermal oxidation of sputtered Ti films

2000 ◽  
Vol 88 (8) ◽  
pp. 4628 ◽  
Author(s):  
Chu-Chi Ting ◽  
San-Yuan Chen ◽  
Dean-Mo Liu
2013 ◽  
Vol 770 ◽  
pp. 225-228
Author(s):  
L. Uttayan ◽  
K. Aiempanakit ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
V. Pattantsetakul ◽  
...  

Titanium dioxide (TiO2) films were prepared by thermal oxidation from Ti films. The Ti films were deposited on glass and silicon (100) wafer substrate by dc magnetron sputtering and subsequent with thermal oxidation process. The crystal structure and morphology of TiO2 films were estimated by using X-ray diffractometry (XRD) and field-emission scanning electron microscopy (FE-SEM), respectively. The optical property of TiO2 films was determined by UV-Visible spectrophotometer. The influences of annealing temperature between 200 to 500°C in air for 1 hour on the structure and optical properties of TiO2 films were investigated. The increasing of annealing temperature was directly affected the phase transition from Ti to TiO2. The optical and structural properties of TiO2 films are the best exhibited with increasing the annealing temperature at 500 °C.


2008 ◽  
Author(s):  
D. Guitoume ◽  
S. Achour ◽  
A. Guittoum ◽  
S. E. H. Abaidia ◽  
El-Hachemi Amara ◽  
...  

2015 ◽  
Vol 159 ◽  
pp. 325-332 ◽  
Author(s):  
Artak Karapetyan ◽  
Anna Reymers ◽  
Suzanne Giorgio ◽  
Carole Fauquet ◽  
Laszlo Sajti ◽  
...  

2017 ◽  
Vol 19 (23) ◽  
pp. 15084-15097 ◽  
Author(s):  
Sundar Kunwar ◽  
Mao Sui ◽  
Puran Pandey ◽  
Quanzhen Zhang ◽  
Ming-Yu Li ◽  
...  

Semi-spherical and irregular Pd nanoparticles and voids are fabricated on sapphire(0001) by the solid-state dewetting of sputter-deposited Pd thin films at different thickness and temperature. The structural evolution, surface morphology transformation and optical properties of Pd nanostructures are probed.


2010 ◽  
Vol 17 (05n06) ◽  
pp. 497-503 ◽  
Author(s):  
F. K. YAM ◽  
S. S. TNEH ◽  
Y.-Q. CHAI ◽  
W. S. LAU ◽  
Z. HASSAN ◽  
...  

In this work, a series of polycrystalline ZnO samples have been synthesized from Zn thin films deposited on Si (100) substrates by using thermal oxidation technique. The ZnO thin film samples grown by this technique were then characterized by a variety of structural and optical characterization tools. The results revealed that the use of novel annealing process i.e. the application of temperature gradient in the thermal treatment could enhance the structural and optical quality of the ZnO thin films significantly as compared to the normal annealing process, i.e. a fixed temperature under different durations. Apart from the improvement of structural and optical properties of ZnO thin films, another striking feature of this novel annealing process was the promotion of the growth of ZnO nanostructures.


2015 ◽  
Vol 1109 ◽  
pp. 544-548 ◽  
Author(s):  
Jian Bo Liang ◽  
Xu Yang Li ◽  
Naoki Kishi ◽  
Tetsuo Soga

Single phase CuO films have been successfully synthesized by thermal oxidation of cupper foil in air with water vapor. The structural and optical properties of CuO films were investigated. It is observed that the grain size increases with increasing the oxidation temperature. The optical band gap of CuO film is determined by the transmittance and reflectance spectra.


Author(s):  
Wael Abdullah

Undoped and halogen-doped zinc oxide thin films are prepared by the thermal oxidation process. Zinc acetate dihydrate, ethanol, and Diethanolamine are used as precursor, solvent, and stabilizer, respectively. In the case of ZnO:Hal. dopant Ammonium chloride NH4Cl 99%, Benzene Bromide C6H5Br, or Benzene Iodide C6H5I for making dopant ZnO thin film with Cl, Br, I respectively is added to the precursor solution with an atomic percentage equal to 2-10.% hal. The transparent solution sprayed onto glass substrates, and are transformed into ZnO upon annealing at 500°C. XRD spectra of ZnO thin films, and optical properties of them as a function of halogen content have been investigated using U.V spectroscopy ( transmittance , refractive index, extinction coefficient and energy band gap ) for undoped and halogen-doped zinc oxide thin films.


2011 ◽  
Vol 26 (1) ◽  
pp. 50-54 ◽  
Author(s):  
Yizhu Xie ◽  
Ziwei Ma ◽  
Yuroug Su ◽  
Yanxia Liu ◽  
Lixin Liu ◽  
...  

Abstract


1997 ◽  
Vol 495 ◽  
Author(s):  
Jianping Zhang ◽  
Burtrand I. Lee ◽  
Feiling Wang ◽  
Melvin A. Leitheiser

ABSTRACTPotassium titanyl phosphate, KTiOPO4 (KTP), thin films were prepared by sol-gel process. The structural evolution of KTP thin films was investigated by means of DTA/TGA, XRD, and FT-IR. The electro-optical results show that KTP thin films have a refractive index of 1.8 and large quadratic electro-optical coefficient of R=2.50643*10−16 and have potential applications for electro-optical devices.


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