High altitude balloon flights of position sensitive CdZnTe detectors for high energy X-ray astronomy

Author(s):  
Kimberly R. Slavis
1998 ◽  
Author(s):  
Kimberly R. Slavis ◽  
Paul F. Dowkontt ◽  
Fred Duttweiller ◽  
John W. Epstein ◽  
Paul L. Hink ◽  
...  

1999 ◽  
Author(s):  
Kimberly R. Slavis ◽  
Paul F. Dowkontt ◽  
Fred Duttweiller ◽  
John W. Epstein ◽  
Paul L. Hink ◽  
...  

2017 ◽  
Vol 12 (12) ◽  
pp. C12037-C12037
Author(s):  
A. Moiseev ◽  
A. Bolotnikov ◽  
G. DeGeronimo ◽  
E. Hays ◽  
R. James ◽  
...  

2010 ◽  
Vol 437 ◽  
pp. 641-645 ◽  
Author(s):  
Michael E. Boiko ◽  
Andrei M. Boiko

The project ISTC “SPECTROMETRIC POSITION SENSITIVE DETECTOR WITH BASE ENERGY SHIFT” is interesting for creation new area semiconductor detector device for EXAFS spectroscopy, for traditional X-ray diffractometry (XRD), as well as Small-Angle X-ray Scattering diffractometry (SASX). Diffractometry methods allow creating original features of position sensitive detector. Crystallography quality of silicon multi layer detector with original photo mask was examined by XRD and SAXS with ordinary scintillation detectors. Grazed incidence SAXS (GISAXS) provides information both about lateral and normal ordering of multilayers at a surface or inside a thin epitaxial film [1]. Using high-energy X-ray source (rotating anode or synchrotron radiation in future) and high adjustment monochromator SAXS rocking curves in transition and reflection mode had been received. It allows obtaining the information of 3D size lamellar or column-like domains. Results of an experimental investigation of the size layer structure are presented.


2011 ◽  
Vol 1 (0) ◽  
pp. 285-287 ◽  
Author(s):  
Yuri NAKAGAWA ◽  
Jun KAWARABAYASHI ◽  
Ken-ichi WATANABE ◽  
Hideki TOMITA ◽  
Hiroyuki TOYOKAWA ◽  
...  

1991 ◽  
Vol 35 (B) ◽  
pp. 1027-1033 ◽  
Author(s):  
Kazutaka Ohashi ◽  
Mamoru Takahashl ◽  
Yohichi Gohshi ◽  
Atsuo Iida ◽  
Shunji Eishimoto

AbstractA wavelength dispersive spectrometer which consists of a flat crystal analyser and a position sensitive proportional counter has been developed for X-ray fluorescence analysis using synchrotron radiation. The advantages of this spectrometer are high energy resolution, multielemental nature, and high efficiency, and these match well "with the high brightness synchrotron X-ray source. The minimum detection limits are of the order of ppm or pg. An application to elemental mapping has also been demonstrated. The present system is useful for practical analysis of small samples or small regions.


2017 ◽  
Author(s):  
Alexey Bolotnikov ◽  
GianLuigi De Geronimo ◽  
Emerson Vernon ◽  
Elizabeth Hays ◽  
David Thompson ◽  
...  

2016 ◽  
Vol 32 (6) ◽  
pp. 778-786 ◽  
Author(s):  
Mehdi Sohrabi ◽  
Amir Hakimi ◽  
Seyed Rabi Mahdavi
Keyword(s):  
X Ray ◽  

Author(s):  
E. B. Steel

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.


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